F8320 X-ray reflection from thin layers

Faculty of Science
Spring 2003
Extent and Intensity
2/0/0. 2 credit(s). Type of Completion: k (colloquium).
Teacher(s)
prof. RNDr. Václav Holý, CSc. (lecturer)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: prof. RNDr. Václav Holý, CSc.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Basic properties of x-rays. X-ray reflection on a single flat interface, kinematical and dynamical description. The Fresnel formulas. X-ray reflection on a system of many flat interfaces, the matrix formalism. Semikinematical approximation. Rough interfaces: The fractal description of a rough interface, the correlation properties. Correlation of rough interfaces in multilayers. The Stearns model. Non-fractal interfaces: descriptions by means of the Markov chains. Singular and vicinal surfaces. Short-range-order and long-range-order models. Kinematical description of the scattering from rough interfaces, semikinematical approximation, the Nevot-Croce formula. Scattering from rough multilayers, distribution of the scattered intensity in reciprocal space. Resonant diffuse scattering. Grazing-indicence diffraction.
Language of instruction
Czech
Further comments (probably available only in Czech)
The course is taught once in two years.
The course is taught: every week.
General note: S.
The course is also listed under the following terms Spring 2001, Spring 2005, Spring 2007.
  • Enrolment Statistics (Spring 2003, recent)
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