F8120 Optics of thin films

Faculty of Science
Spring 2005
Extent and Intensity
2/1/0. 2 credit(s). Type of Completion: z (credit).
Teacher(s)
prof. RNDr. Ivan Ohlídal, DrSc. (lecturer)
prof. RNDr. Ivan Ohlídal, DrSc. (seminar tutor)
Guaranteed by
prof. RNDr. Jan Janča, DrSc.
Department of Plasma Physics and Technology – Physics Section – Faculty of Science
Contact Person: prof. RNDr. Ivan Ohlídal, DrSc.
Timetable
Thu 9:00–10:50 F23-202, Thu 11:00–11:50 F23-202
Prerequisites
It is necessary to pass out the subect Vibrations, waves, optics.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Optics of thin films belongs to the importantant branches of physics of thin films. Results achieved within this branch are used in the fundamental research and practice. In this lecture a review of the basic theoretical results concerning optics of thin films is presented. Moreover, main applications of these theoretical results in pratice are introduced as well. In the introduction of the lecture the mathematical (ideal) model of the multilayer systems usable for formulating the theory of optics of these systems within classical (phenomenological) approach is described. Further, formulae for calculating the values of the optical quantities measured in experiments are derived. Thus, the formulae for reflectances, transmittances, ellipsometric parameters and phase changes of the multilayer systems are derived in this part of the lecture. For this derivations two basic approaches are used. The first approach is based on the model of multiple-beam interference of light inside films and the latter one is based on the matrix formulation. Then examples of using the formulae derived for calculating the spectral and angular dependences of the reflectances and transmittances of some multilayer systems employed in optics industry are presented. Furthermore, the basic methods for the optical analysis of the thin films are desribed. It is shown that using the corresponding theoretical approaches and experimental data one determines the values of the optical constants and thicknesses characterizing the multilayer system analyzed. Some methods of the optical synthesis of the thin films are presented too. The methods enabling us to propose the systems with the required values of the optical quantities of some multilayer systems are described. An attention is devoted to the systems forming antireflection coatings, laser mirrors and monochromatic interference filters in transmitted light. An influence of some defects on the values of the optical quantities of the multilayer systems is studied as well. The influence of roughness of the boundaries, columnar structure and transition layers on these quantities is described in detail. In the conclusion the propagation of light within the thin films working as waveguides is explained. Thus, the basic results concerning planar optics is presented. The theoretical results obtained within the lecture are trained through suitable exercises.
Syllabus
  • 1. Mathematical (ideal) model of multilayer systems suitable for formulating the theory within the classical (phenomenological) approach. 2. Derivation of the formulae for the optical quantities of the multilayer systems using the model based on multiple-beam interference of light inside the thin films forming these systems. 3. Derivation of the formulae for the optical quantities of the multilayer systems using the matrix approach. 4. Examples of calculating both the spectral and angular dependences of the reflectances and transmittances of the multilayer systems employed in optics industry. 5. Methods of the optical analysis of the multilayer systems. 6. Methods of the optical synthesis of the multilayer systems. 7. Influence of some defects on the values of the optical quantities of the thin films (influence of boundary roughness, influence of columnar structure and influence of the transition interlayers). 8. Planar optics (propagation of light inside thin films forming waveguides).
Assessment methods (in Czech)
Přednáška a cvičení, předmět bude zakončen zápočtem.
Language of instruction
Czech
Further comments (probably available only in Czech)
The course is taught once in two years.
General note: S.
The course is also listed under the following terms Spring 2011 - only for the accreditation, Spring 2001, Spring 2003, Spring 2007, Spring 2009, Spring 2011, spring 2012 - acreditation, Spring 2013, Spring 2015, Spring 2017, Spring 2019, Spring 2021, Spring 2023, Spring 2025.
  • Enrolment Statistics (Spring 2005, recent)
  • Permalink: https://is.muni.cz/course/sci/spring2005/F8120