The course introduces the students into basic experimental methods in solid state physics (texts for individual tasks are on the lecture web site).
Mainly methods of x-ray diffraction and reflection, optical reflectometry and elipsometry, atomic force microscopy, Hall effect and work in clean rooms are studied.
The main objective of the course is to provide the students with the ability to
- list and describe selected fundamental experimental techiques in condensed matter physics
- individually apply these techniques during measurement of important solid state quantities.
List of tasks:
1. Emission and absorption x-ray spectrum.
2. Orientation of monocrystal surface.
3. Monocrystal orientation using Laue method.
4. Powder diffractometry of cubic material.
5. X-ray reflectometry measurement of thin layer thickness.
6. Surface studies usin AFM.
7. Refractive index and thickness of thin layer using elipsometry.
8. Optical reflectivity of silicon.
9. Hall effect in metal and semiconductor.
10.Microelectronics in a clean room and principles of photolithography.
ASHCROFT, Neil W. and N. David MERMIN. Solid state physics. South Melbourne: Brooks/Cole, 1976. xxi, 826 s. ISBN 0-03-083993-9. info
KITTEL, Charles. Úvod do fyziky pevných látek : Introduction to solid state physics (Orig.). 1. vyd. Praha: Academia, 1985. 598 s. info
Course attendace is mandatory.
Student has to present 10 tested protocols. Overall classification is determined by the grades of individual protocols.
Oral testing of protocols is by the agreement with the lecturer of appropriate task.