Information System of Masaryk University 

Course Information

F6390 Solid state physics laboratory

Faculty of Science
Spring 2010

Extent and Intensity

0/3/0. 5 credit(s) (plus extra credits for completion). Type of Completion: graded credit.

Teacher(s)

RNDr. Luděk Bočánek, CSc. (seminar tutor)
Mgr. Ondřej Caha, Ph.D. (seminar tutor)
doc. RNDr. Jan Celý, CSc. (seminar tutor)
Mgr. Karel Kubíček, PhD. (seminar tutor)
doc. RNDr. Petr Mikulík, Ph.D. (seminar tutor)
Mgr. Mojmír Meduňa, Ph.D. (alternate examiner)

Supervisor

prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics - Physics Section - Faculty of Science

Timetable

Thu 9:00–11:50 Fpk,04013

Prerequisites (in Czech)

F2180 Physical laboratory 1 && F3240 Physical laboratory 2 && F4210 Physical laboratory 3

Course Enrollment Limitations

The course is also offered to the students of the fields other than those the course is directly associated with.

Fields of study the course is directly associated with

• Physics (programme PřF, B-FY)
• Physics (programme PřF, M-FY)
• Physics (programme PřF, N-FY)

Course objectives

The course introduces the students into basic experimental methods in solid state physics (texts for individual tasks are on the lecture web site). Mainly methods of x-ray diffraction and reflection, optical reflectometry and elipsometry, atomic force microscopy, Hall effect and work in clean rooms are studied.

The main objective of the course is to provide the students with the ability to
- list and describe selected fundamental experimental techiques in condensed matter physics
- individually apply these techniques during measurement of important solid state quantities.

Syllabus

• List of tasks: 1. Emission and absorption x-ray spectrum. 2. Orientation of monocrystal surface. 3. Monocrystal orientation using Laue method. 4. Powder diffractometry of cubic material. 5. X-ray reflectometry measurement of thin layer thickness. 6. Surface studies usin AFM. 7. Refractive index and thickness of thin layer using elipsometry. 8. Optical reflectivity of silicon. 9. Hall effect in metal and semiconductor. 10.Microelectronics in a clean room and principles of photolithography.

Literature

• ASHCROFT, Neil W. and N. David MERMIN. Solid state physics. South Melbourne: Brooks/Cole, 1976. xxi, 826 s. ISBN 0-03-083993-9. info
• KITTEL, Charles. Úvod do fyziky pevných látek : Introduction to solid state physics (Orig.). 1. vyd. Praha: Academia, 1985. 598 s. info

Teaching methods

Laboratory practice

Assessment methods

Course attendace is mandatory. Student has to present 10 tested protocols. Overall classification is determined by the grades of individual protocols. Oral testing of protocols is by the agreement with the lecturer of appropriate task.

Further Comments

Study Materials
The course is taught annually.

Teacher's information

http://www.physics.muni.cz/kfpf/Vyuka/

The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2011 - only for the accreditation, Spring 2000, Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2011, spring 2012, spring 2012 - acreditation, spring 2013, spring 2014.

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• Enrollment Statistics (Spring 2010, recent)
  
• Permalink: https://is.muni.cz/course/sci/spring2010/F6390

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