F8572 Experimental methods and special laboratory 2 (B)

Faculty of Science
Spring 2001
Extent and Intensity
2/4/0. 8 credit(s). Type of Completion: graded credit.
Teacher(s)
RNDr. Luděk Bočánek, CSc. (lecturer)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Jan Hlávka, CSc.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Preparation of sample for measurement. Drift mobility of carriers. Electric conductivity, Hall coefficient and magnetoresistance of semiconductor. Recombination of excess carriers in semiconductor, fifetimeof carriers. Temperature dependence of mobility. Termoelectric force in semiconductor. Retermination of interstitial oxygen concentration in silicon. Current - voltage charakteristic of p-n junctions. Refraction index and thick of thin layer measurement by elipsometr. Determination of refraction index and thick of thin layer from reflection spectra.
Language of instruction
Czech
Further Comments
The course is taught annually.
The course is taught: every week.
The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2011 - only for the accreditation, Spring 2000, Spring 2002, Spring 2003, Spring 2004, Spring 2005, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010, Spring 2011, Spring 2012, spring 2012 - acreditation, Spring 2013, Spring 2014, Spring 2015, Spring 2016, Spring 2017, spring 2018, Spring 2019, Spring 2020, Spring 2021, Spring 2022, Spring 2023, Spring 2024, Spring 2025.
  • Enrolment Statistics (Spring 2001, recent)
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