2001
X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
ULYANENKOV, A., K. INABA, Petr MIKULÍK, N. DAROWSKI, K. OMOTE et. al.Základní údaje
Originální název
X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
Autoři
ULYANENKOV, A., K. INABA, Petr MIKULÍK (203 Česká republika, garant), N. DAROWSKI, K. OMOTE, J. GRENZER a A. FORCHEL
Vydání
J. Phys. D: Appl. Phys. Velká Britanie, IOP Publishing Ltd, 2001, 0022-3727
Další údaje
Jazyk
angličtina
Typ výsledku
Článek v odborném periodiku
Obor
10302 Condensed matter physics
Stát vydavatele
Velká Británie a Severní Irsko
Utajení
není předmětem státního či obchodního tajemství
Odkazy
Impakt faktor
Impact factor: 1.260
Kód RIV
RIV/00216224:14310/01:00004229
Organizační jednotka
Přírodovědecká fakulta
UT WoS
000169093700038
Klíčová slova anglicky
reflectivity; diffraction; xrd; gid; xrr; quantum wires; GaAs; GaInAs
Štítky
Příznaky
Mezinárodní význam, Recenzováno
Změněno: 12. 2. 2007 19:01, doc. RNDr. Petr Mikulík, Ph.D.
Anotace
V originále
Combined x-ray diffraction and reflectivity experiments have been performed on free-standing trapezoidal GaAs/InGaAs quantum wires using a conventional x-ray tube. Interpreting the intensity distribution around (004) by curve simulation of the extracted coherent grating truncation rods on the basis of a semikinematical diffraction theory (DWBA) the shape and geometric parameters as well as the strain within the wires could be determined taking the results of a finite element calculation of the atomic displacements into account. The map of the coplanar x-ray reflectivity around (000), as well as the intensity profiles of the coherent grating truncation rods, located equidistantly around the specularly reflected beam, have been recorded in order to estimate the roughness properties of the sample interfaces as well as the wire shape and layer set-up without the influence of strain. All small-angle as well as wide-angle scattering experimental results went in to the mutually consistent estimate of the sample properties. The experiments performed for a conventional x-ray tube supply a parameter set comparable in completeness and precision to that obtained from similar samples by interpreting synchrotron experiments.
Návaznosti
GA202/99/P064, projekt VaV |
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VS96102, projekt VaV |
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