ROCH, Tomáš a Václav HOLÝ. Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. Physical Review B. USA: American Physical Society, 2002, B65, č. 11, s. 245324-234336, 12 s. ISSN 0163-1829. |
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@article{485816, author = {Roch, Tomáš and Holý, Václav}, article_location = {USA}, article_number = {11}, keywords = {Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction}, language = {eng}, issn = {0163-1829}, journal = {Physical Review B}, title = {Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction}, volume = {B65}, year = {2002} }
TY - JOUR ID - 485816 AU - Roch, Tomáš - Holý, Václav PY - 2002 TI - Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction JF - Physical Review B VL - B65 IS - 11 SP - 245324-234336 EP - 245324-234336 PB - American Physical Society SN - 01631829 KW - Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction N2 - Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction ER -
ROCH, Tomáš a Václav HOLÝ. Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. \textit{Physical Review B}. USA: American Physical Society, 2002, B65, č.~11, s.~245324-234336, 12 s. ISSN~0163-1829.
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