| ROCH, Tomáš a Václav HOLÝ. Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. Physical Review B. USA: American Physical Society, 2002, B65, č. 11, s. 245324-234336, 12 s. ISSN 0163-1829. |
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@article{485816,
author = {Roch, Tomáš and Holý, Václav},
article_location = {USA},
article_number = {11},
keywords = {Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction},
language = {eng},
issn = {0163-1829},
journal = {Physical Review B},
title = {Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction},
volume = {B65},
year = {2002}
}
TY - JOUR
ID - 485816
AU - Roch, Tomáš - Holý, Václav
PY - 2002
TI - Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
JF - Physical Review B
VL - B65
IS - 11
SP - 245324-234336
EP - 245324-234336
PB - American Physical Society
SN - 01631829
KW - Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
N2 - Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
ER -
ROCH, Tomáš a Václav HOLÝ. Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. \textit{Physical Review B}. USA: American Physical Society, 2002, B65, č.~11, s.~245324-234336, 12 s. ISSN~0163-1829.
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