| STANGL, Julian, Anke HESSE, Tomáš ROCH a Václav HOLÝ. Structural investigation of semiconductor nanostructures by x-ray techniques. Nuclear Instruments & Methods in Physics Research A. 2002, roč. 200, č. 1, s. 11-23. ISSN 0168-9002. |
Další formáty:
BibTeX
LaTeX
RIS
@article{485825,
author = {Stangl, Julian and Hesse, Anke and Roch, Tomáš and Holý, Václav},
article_number = {1},
keywords = {Structural investigation of semiconductor nanostructures by x-ray techniques},
language = {eng},
issn = {0168-9002},
journal = {Nuclear Instruments & Methods in Physics Research A},
title = {Structural investigation of semiconductor nanostructures by x-ray techniques},
volume = {200},
year = {2002}
}
TY - JOUR
ID - 485825
AU - Stangl, Julian - Hesse, Anke - Roch, Tomáš - Holý, Václav
PY - 2002
TI - Structural investigation of semiconductor nanostructures by x-ray techniques
JF - Nuclear Instruments & Methods in Physics Research A
VL - 200
IS - 1
SP - 11-23
EP - 11-23
SN - 01689002
KW - Structural investigation of semiconductor nanostructures by x-ray techniques
N2 - Structural investigation of semiconductor nanostructures by x-ray techniques
ER -
STANGL, Julian, Anke HESSE, Tomáš ROCH a Václav HOLÝ. Structural investigation of semiconductor nanostructures by x-ray techniques. \textit{Nuclear Instruments \&{} Methods in Physics Research A}. 2002, roč.~200, č.~1, s.~11-23. ISSN~0168-9002.
|
