| DARHUBER, A.A., Václav HOLÝ, P. SCHITTENHELM, J. STANGL, I. KEGEL, Z. KOVATS, T.H. METZGER, G. BAUER, G. ABSTREITER a G. GRUEBEL. Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods. Physica E 2. Amsterdam, 1998, roč. 1998, -, s. 789-793. ISSN 1386-9477. |
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@article{200251,
author = {Darhuber, A.A. and Holý, Václav and Schittenhelm, P. and Stangl, J. and Kegel, I. and Kovats, Z. and Metzger, T.H. and Bauer, G. and Abstreiter, G. and Gruebel, G.},
article_location = {Amsterdam},
article_number = {-},
keywords = {multilayers by x-ray},
language = {eng},
issn = {1386-9477},
journal = {Physica E 2},
title = {Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods},
volume = {1998},
year = {1998}
}
TY - JOUR
ID - 200251
AU - Darhuber, A.A. - Holý, Václav - Schittenhelm, P. - Stangl, J. - Kegel, I. - Kovats, Z. - Metzger, T.H. - Bauer, G. - Abstreiter, G. - Gruebel, G.
PY - 1998
TI - Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods
JF - Physica E 2
VL - 1998
IS - -
SP - 789
EP - 789
SN - 13869477
KW - multilayers by x-ray
ER -
DARHUBER, A.A., Václav HOLÝ, P. SCHITTENHELM, J. STANGL, I. KEGEL, Z. KOVATS, T.H. METZGER, G. BAUER, G. ABSTREITER a G. GRUEBEL. Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods. \textit{Physica E 2}. Amsterdam, 1998, roč.~1998, -, s.~789-793. ISSN~1386-9477.
|
