| BORTCHAGOVSKY, E., I. YURCHENKO, Z. KAZANTSEVA, Josef HUMLÍČEK a J. HORA. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. Thin Solid Films. UK Oxford: Elsevier science, 1998, roč. 1998, 313-314, s. 795-798. ISSN 0040-6090. |
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@article{200255,
author = {Bortchagovsky, E. and Yurchenko, I. and Kazantseva, Z. and Humlíček, Josef and Hora, J.},
article_location = {UK Oxford},
article_number = {313-314},
keywords = {ellipsometry},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation},
volume = {1998},
year = {1998}
}
TY - JOUR
ID - 200255
AU - Bortchagovsky, E. - Yurchenko, I. - Kazantseva, Z. - Humlíček, Josef - Hora, J.
PY - 1998
TI - Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation
JF - Thin Solid Films
VL - 1998
IS - 313-314
SP - 795
EP - 795
PB - Elsevier science
SN - 00406090
KW - ellipsometry
ER -
BORTCHAGOVSKY, E., I. YURCHENKO, Z. KAZANTSEVA, Josef HUMLÍČEK a J. HORA. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. \textit{Thin Solid Films}. UK Oxford: Elsevier science, 1998, roč.~1998, 313-314, s.~795-798. ISSN~0040-6090.
|
