| JERGEL, M., Václav HOLÝ, E. MAJKOVÁ, S. LUBY, R. SENDERÁK, H.J. STOCK, D. MENKE, U. KLEINEBERG a U. HEINZMANN. X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. Physica B condensed matter. Amsterdam: Elsevier Science, 1998, roč. 253(1998), -, s. 28-39. ISSN 0921-4526. |
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@article{200356,
author = {Jergel, M. and Holý, Václav and Majková, E. and Luby, S. and Senderák, R. and Stock, H.J. and Menke, D. and Kleineberg, U. and Heinzmann, U.},
article_location = {Amsterdam},
article_number = {-},
language = {eng},
issn = {0921-4526},
journal = {Physica B condensed matter},
title = {X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics},
volume = {253(1998)},
year = {1998}
}
TY - JOUR
ID - 200356
AU - Jergel, M. - Holý, Václav - Majková, E. - Luby, S. - Senderák, R. - Stock, H.J. - Menke, D. - Kleineberg, U. - Heinzmann, U.
PY - 1998
TI - X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics
JF - Physica B condensed matter
VL - 253(1998)
IS - -
SP - 28
EP - 28
PB - Elsevier Science
SN - 09214526
ER -
JERGEL, M., Václav HOLÝ, E. MAJKOVÁ, S. LUBY, R. SENDERÁK, H.J. STOCK, D. MENKE, U. KLEINEBERG a U. HEINZMANN. X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. \textit{Physica B condensed matter}. Amsterdam: Elsevier Science, 1998, roč.~253(1998), -, s.~28-39. ISSN~0921-4526.
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