NAVRÁTIL, Karel, Jan ŠIK, Josef HUMLÍČEK a S. NEŠPŮREK. Optical properties of thin films of poly(methyl-phenylsilylene). Optical Materials. Amsterdam: Elsevier, 1999, roč. 1999, č. 12, s. 105-113. ISSN 0925-3467. |
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@article{215731, author = {Navrátil, Karel and Šik, Jan and Humlíček, Josef and Nešpůrek, S.}, article_location = {Amsterdam}, article_number = {12}, language = {eng}, issn = {0925-3467}, journal = {Optical Materials}, title = {Optical properties of thin films of poly(methyl-phenylsilylene)}, volume = {1999}, year = {1999} }
TY - JOUR ID - 215731 AU - Navrátil, Karel - Šik, Jan - Humlíček, Josef - Nešpůrek, S. PY - 1999 TI - Optical properties of thin films of poly(methyl-phenylsilylene) JF - Optical Materials VL - 1999 IS - 12 SP - 105 EP - 105 PB - Elsevier SN - 09253467 N2 - We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV. ER -
NAVRÁTIL, Karel, Jan ŠIK, Josef HUMLÍČEK a S. NEŠPŮREK. Optical properties of thin films of poly(methyl-phenylsilylene). \textit{Optical Materials}. Amsterdam: Elsevier, 1999, roč.~1999, č.~12, s.~105-113. ISSN~0925-3467.
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