GRIM, Jan, Václav HOLÝ, Josef KUBĚNA, A.A. DARHUBER, S. ZERLAUTH a G. BAUER. X-ray reflection from self-organized interfaces in an SiGe/Si multilayer. Semicond. Sci. Technol. Velká Britanie: IOP Publishing Ltd, 1999, roč. 14(1999), -, s. 32-40. ISSN 0268-1242. |
Další formáty:
BibTeX
LaTeX
RIS
@article{216291, author = {Grim, Jan and Holý, Václav and Kuběna, Josef and Darhuber, A.A. and Zerlauth, S. and Bauer, G.}, article_location = {Velká Britanie}, article_number = {-}, language = {eng}, issn = {0268-1242}, journal = {Semicond. Sci. Technol.}, title = {X-ray reflection from self-organized interfaces in an SiGe/Si multilayer}, volume = {14(1999)}, year = {1999} }
TY - JOUR ID - 216291 AU - Grim, Jan - Holý, Václav - Kuběna, Josef - Darhuber, A.A. - Zerlauth, S. - Bauer, G. PY - 1999 TI - X-ray reflection from self-organized interfaces in an SiGe/Si multilayer JF - Semicond. Sci. Technol. VL - 14(1999) IS - - SP - 32 EP - 32 PB - IOP Publishing Ltd SN - 02681242 ER -
GRIM, Jan, Václav HOLÝ, Josef KUBĚNA, A.A. DARHUBER, S. ZERLAUTH a G. BAUER. X-ray reflection from self-organized interfaces in an SiGe/Si multilayer. \textit{Semicond. Sci. Technol.}. Velká Britanie: IOP Publishing Ltd, 1999, roč.~14(1999), -, s.~32-40. ISSN~0268-1242.
|