| KANG, H.H., G. SPRINGHOLZ, V. HOLY a G. BAUER. TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature. Materials Science and Engineering. Lausanne: ELSEVIER SCIENCE SA, 2001, roč. 80, 1-3, s. 104-108. ISSN 0921-5107. |
Další formáty:
BibTeX
LaTeX
RIS
@article{385313,
author = {Kang, H.H. and Springholz, G. and Holy, V. and Bauer, G.},
article_location = {Lausanne},
article_number = {1-3},
keywords = {ISLANDS; SUPERLATTICES; STRAIN; GAAS},
language = {eng},
issn = {0921-5107},
journal = {Materials Science and Engineering},
title = {TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature},
volume = {80},
year = {2001}
}
TY - JOUR
ID - 385313
AU - Kang, H.H. - Springholz, G. - Holy, V. - Bauer, G.
PY - 2001
TI - TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature
JF - Materials Science and Engineering
VL - 80
IS - 1-3
SP - 104
EP - 104
PB - ELSEVIER SCIENCE SA
SN - 09215107
KW - ISLANDS
KW - SUPERLATTICES
KW - STRAIN
KW - GAAS
N2 - PbSe quantum dot/PbEuTe superlattices were grown on PbTe/BaF2(111) using molecular beam epitaxy. The spacer thickness was varied From 32.4 to 312 nm and the growth temperature was 335 or 380 degreesC. Three different dot stacking sequences form with either vertical, face-centered cubic like or disordered stacking sequence along the [111] growth direction. The different stacking sequence can be controlled by the thickness of the spacer layer and the growth temperature, The dots are fully strained and the shape of the dots is either triangular pyramids or dome like depending on the spacer layer thickness. An analysis of the lateral and vertical correlation of the dots as well as the size and shape of the buried dots with respect to spacer thickness and growth temperature is presented.
ER -
KANG, H.H., G. SPRINGHOLZ, V. HOLY a G. BAUER. TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature. \textit{Materials Science and Engineering}. Lausanne: ELSEVIER SCIENCE SA, 2001, roč.~80, 1-3, s.~104-108. ISSN~0921-5107.
|
