Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate ...

@article{555797,
   author = {Bernhard, Christian and Humlíček, Josef and Keimer, Bernhard},
   article_location = {Oxford},
   article_number = {1},
   keywords = {Superconductors; Dielectric; Ellipsometer},
   language = {eng},
   issn = {0040-6090},
   journal = {Thin Solid Films},
   title = {Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors},
   volume = {455-456},
   year = {2004}
}

TY  - JOUR
ID  - 555797
AU  - Bernhard, Christian - Humlíček, Josef - Keimer, Bernhard
PY  - 2004
TI  - Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors
JF  - Thin Solid Films
VL  - 455-456
IS  - 1
SP  - 143-149
EP  - 143-149
PB  - Elsevier
SN  - 00406090
KW  - Superconductors
KW  - Dielectric
KW  - Ellipsometer
N2  - We describe the setup of an ellipsometer for the far- to mid-infrared (FIR-MIR) spectral range that is used in combination with a Fourier-transform infrared (FTIR) spectrometer and a synchrotron light source.We present the outline of the ellipsometer and discuss how it has been optimized in order to perform accurate ellipsometric measurements on relatively small single crystals of the cuprate high-T superconductors (HTSC) and other oxide based compounds with strongly correlated charge carriers. We present ellipsometric spectra for the HTSC compounds BiSrCaCuO and YBaCuO.
ER  - 

BERNHARD, Christian, Josef HUMLÍČEK a Bernhard KEIMER. Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors. \textit{Thin Solid Films}. Oxford: Elsevier, 2004, roč.~455-456, č.~1, s.~143-149. ISSN~0040-6090.