Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films

@inproceedings{557199,
   author = {Hartmanová, Marie and Navrátil, Vladislav and Navrátil, Karel and Jergel, Marian and Gmucova, Kateřina and Gandarilla, Fjod Alexandrovič and Zemek, Jan and Chromik, Sergej and Kundracik, František},
   address = {Teheran, Iran},
   booktitle = {Physics and Technology of Thin Films IWTF 2003},
   edition = {I.},
   keywords = {yttria stabilized zirconia; thin films; microhardness; structure; electrical conductivity.},
   language = {eng},
   location = {Teheran, Iran},
   pages = {158-168},
   publisher = {World Scientific},
   title = {Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films},
   year = {2004}
}

TY  - JOUR
ID  - 557199
AU  - Hartmanová, Marie - Navrátil, Vladislav - Navrátil, Karel - Jergel, Marian - Gmucova, Kateřina - Gandarilla, Fjod Alexandrovič - Zemek, Jan - Chromik, Sergej - Kundracik, František
PY  - 2004
TI  - Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films
PB  - World Scientific
CY  - Teheran, Iran
KW  - yttria stabilized zirconia
KW  - thin films
KW  - microhardness
KW  - structure
KW  - electrical conductivity.
N2  - The physical (optical, mechanical and electrical) parameters of yttria stabilized thin zirconia films are presented. The dependence of these parameters on technology is also studied.
ER  - 

HARTMANOVÁ, Marie, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Marian JERGEL, Kateřina GMUCOVA, Fjod Alexandrovič GANDARILLA, Jan ZEMEK, Sergej CHROMIK a František KUNDRACIK. Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films. In \textit{Physics and Technology of Thin Films IWTF 2003}. I. Teheran, Iran: World Scientific, 2004, s.~158-168.