Diffuse X-ray scattering from GaN/SiC (0001) thin films

@article{709114,
   author = {Holý, Václav and Daniš, Stanislav},
   article_number = {1},
   keywords = {Diffuse X-ray scattering from GaN/SiC (0001) thin films},
   language = {eng},
   issn = {0044-2968},
   journal = {Zeitschrift für Kristallographie},
   title = {Diffuse X-ray scattering from GaN/SiC (0001) thin films},
   volume = {141-146},
   year = {2006}
}

TY  - JOUR
ID  - 709114
AU  - Holý, Václav - Daniš, Stanislav
PY  - 2006
TI  - Diffuse X-ray scattering from GaN/SiC (0001) thin films
JF  - Zeitschrift für Kristallographie
VL  - 141-146
IS  - 1
SP  - 23-27
EP  - 23-27
SN  - 00442968
KW  - Diffuse X-ray scattering from GaN/SiC (0001) thin films
N2  - Diffuse X-ray scattering from GaN/SiC (0001) thin films
ER  - 

HOLÝ, Václav a Stanislav DANIŠ. Diffuse X-ray scattering from GaN/SiC (0001) thin films. \textit{Zeitschrift für Kristallographie}. 2006, roč.~141-146, č.~1, s.~23-27. ISSN~0044-2968.