LI, J.H. and Václav HOLÝ. Strain relaxation in high electron mobility Si 1-x Ge x/Si structures. J. Appl. Phys. 1997, (82)1997, No 15, p. 2881-2966. ISSN 0021-8979.
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Basic information
Original name Strain relaxation in high electron mobility Si 1-x Ge x/Si structures
Authors LI, J.H. and Václav HOLÝ.
Edition J. Appl. Phys. 1997, 0021-8979.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United States of America
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 1.630
RIV identification code RIV/00216224:14310/97:00000552
Organization unit Faculty of Science
Changed by Changed by: prof. RNDr. Václav Holý, CSc., učo 1656. Changed: 20/3/2000 07:08.
Links
MSM 143100002, plan (intention)Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures
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