PřF:F7811 Electron optics and Microsc. 1 - Course Information
F7811 Electron optics and Microscopy 1
Faculty of ScienceAutumn 2024
- Extent and Intensity
- 2/1/0. 3 credit(s) (plus extra credits for completion). Type of Completion: zk (examination).
- Teacher(s)
- Mgr. Tomáš Radlička, Ph.D. (lecturer)
Mgr. Jan Stopka, Ph.D. (lecturer)
prof. Mgr. Tomáš Tyc, Ph.D. (lecturer) - Guaranteed by
- prof. Mgr. Tomáš Tyc, Ph.D.
Department of Theoretical Physics and Astrophysics – Physics Section – Faculty of Science
Contact Person: Mgr. Tomáš Radlička, Ph.D.
Supplier department: Department of Theoretical Physics and Astrophysics – Physics Section – Faculty of Science - Prerequisites
- Basic knowledge of optics and theoretical mechanics, knowledge of mathematics
- Course Enrolment Limitations
- The course is also offered to the students of the fields other than those the course is directly associated with.
- fields of study / plans the course is directly associated with
- Physics (programme PřF, N-FY)
- Course objectives
- The student gets an orientation in the basics of electron optics with their application to systems used in electron optics. In particular, a) Paraxial approximation for systems with a straight and curved axis b) Effect of geometric, chromatic and wave aberrations on the resulting electron microscope image c) Effect of misalignment aberrations and their correction d) Methods of correction of geometric and chromatic aberrations
- Learning outcomes
- After completing the course, the student will be able to: Describe the basic electron-optical properties of a beam in an electron microscope Quantitatively describe the effect of aberrations on the resolution of an electron microscope Describe the influence of misalignment of individual elements of the microscope and to propose methods of their correction
- Syllabus
- Analogy between electron and light optics, Index of refraction, equation of trajectory and conservation of directional current density Description of electromagnetic fields of elements used in electron optics Paraxial approximation: axially symmetrical systems, quadrupoles, systems with curved axis Misalignment aberrations and their correction Basic geometric and chromatic aberration Wave optical description of the electron beam - paraxial description, influence of aberrations.
- Literature
- HAWKES, Peter W and Erwin KASPER. Principles of Electron Optics: Basic Geometrical Optics. Academic Press, 1989. ISBN 0123333512. info
- HAWKES, Peter W and Erwin KASPER. Principles of Electron Optics: Applied Geometrical Optics. Academic Press, 1989. ISBN 0123333520. info
- HAWKES, Peter W and Erwin KASPER. Principles of Electron Optics: Wave Optics. Academic Press, 1994. ISBN 0123333547. info
- LENCOVÁ, Bohumila and Michal LENC. Optické prvky elektronových mikroskopů. In Academia. Praha: Academia, 1996, p. 15-62. ISBN 80-200-0329-0. info
- Teaching methods
- Lectures and seminars
- Assessment methods
- Oral exam Homework - discussion of a non-trivial problem in charged particle optics.
- Language of instruction
- Czech
- Follow-Up Courses
- Further Comments
- The course can also be completed outside the examination period.
The course is taught annually.
The course is taught: every week.
- Enrolment Statistics (recent)
- Permalink: https://is.muni.cz/course/sci/autumn2024/F7811