PřF:F7320 Atomic force microscopy - Course Information
F7320 Atomic force microscopy and other methods of scanning probe microscopyFaculty of Science
- Extent and Intensity
- 2/0/0. 2 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
- prof. RNDr. Ivan Ohlídal, DrSc. (lecturer)
- Guaranteed by
- prof. RNDr. Ivan Ohlídal, DrSc.
Department of Physical Electronics - Physics Section - Faculty of Science
Contact Person: prof. RNDr. Ivan Ohlídal, DrSc.
Supplier department: Department of Physical Electronics - Physics Section - Faculty of Science
- It is necessary to pass out the subject F1030 Mechanics and Molecular Physics.
- Course Enrolment Limitations
- The course is also offered to the students of the fields other than those the course is directly associated with.
- fields of study / plans the course is directly associated with
- Physics (programme PřF, M-FY)
- Upper Secondary School Teacher Training in Physics (programme PřF, M-FY)
- Course objectives
- The purpose of this course is to present the bases of atomic force microscopy and related scanning probe microscopy techniques such as scanning tunneling microscopy, magnetic force microscopy, thermal force microscopy, electrostatic tunneling microscopy and scanning near-optics microscopy. These scanning probe microscopy techniques belong to modern diagnostic techniques that are frequently employed for analysis of morphology of various objects in micro-metric and nano-metric scales in three last decades. The main aims of the course are as follows:
1) explanation of the theoretical principles of interactions taking place in microscopes corresponding to the individual scanning probe microscopy techniques
2) quantitative description of main processes taking place at realization of measurements within above mentioned techniques using the corresponding theoretical approaches
3) description of experimental aspects of practical features of the individual techniques
4) classification of systematic errors existing for the individual techniques
5) summarization of applications of the individual scanning probe microscopy techniques within physics and chemistry of solid surfaces and thin films, biology, medicine and check of quality in several branches of industry
6) discussion of combinations of scanning probe microscopy techniques (in particular atomic force microscopy) with other experimental methods (e.g. optical methods) at the complex analysis of solid surfaces
Students passing through this course obtain knowledge enabling them to perform usual measurements using these scanning probe techniques after their simple training on a particular microscope. Moreover, they will be able to perform an interpretation of these measurements. After passing this course the students can proceed in special studies concerning scanning probe microscopy techniques in special literature (e.g. in monographs and journals) and thus they can become experts in this field of science.
- 1. Different theoretical approaches at the description of the interaction between the tip of the microscope and the surface of the object studied (no-contact and contact modes)
- 2. Discussion of these approaches from the point of their use in atomic force microscopy (AFM)
- 3. Experimental set up of the typical AFM microscope
- 4. Influence the force interaction between the tip and the surface on working the AFM microscope (record of the relief of the sample under study)
- 5. Basic methods of calibrating the AFM microscope
- 6. Application of AFM at analyzing surface roughness,upper boundaries of the thin films and structure of these films
- 7. Other application of AFM in biology, biophysics, chemistry and medicine
- 8. Combination of AFM with the other methods (e.g. optical methods) at analyzing both surfaces of solids and thin films
- 9. Theoretical and experimental principles of magnetic force microscopy (MFM), scanning thermic microscopy (STEM), scanning tunneling microscopy (STM) and scanning near optics microscopy (SNOM)
- 10. Applications of MFM, STEM, STM and SNOM in practice
- 11. Comparison of AFM, MSM, STEM, STM and SNOM.
- Yongho Seo, Wonho Jhe, Atomic force microscopy and spectroscopy, Rep. Prog. Phys. 71 (2008) 1-23
- R. Kubínek, M. Vůjtek, M. Mašláň, Mikroskopie skenující sondou, Univerzita Palackého v Olomouci, Olomouc, 2003
- Teaching methods
- Assessment methods
- Written test (minimum 40 points) plus oral exam.
- Language of instruction
- Further Comments
- The course is taught annually.
The course is taught: every week.