F7360 Characterization of Surfaces and Thin Films

Faculty of Science
spring 2018
Extent and Intensity
2/0/0. 1 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
Teacher(s)
doc. Mgr. Lenka Zajíčková, Ph.D. (lecturer)
Guaranteed by
prof. RNDr. Jan Janča, DrSc.
Department of Plasma Physics and Technology – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Lenka Zajíčková, Ph.D.
Supplier department: Department of Plasma Physics and Technology – Physics Section – Faculty of Science
Timetable
Thu 16:00–17:50 Fs2 6/4003
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
This course gives overview of physical methods for characterization of surfaces and thin films. At the end of the course students should be able to: explain differences between types of solids; explain differences between different bonds in solids; discuss processes on clean surfaces; discuss adsorption and chemisorption; compare interactions of materials with various radiations including electron and ion beams; debate on selection of characterization methods for particular material and problem of analysis.
Syllabus
  • 1. Bonds in solids (ionic, covalent, van der Waals, metallic) 2. Types of materials (crystal structures, ceramics, glasses, metals, polymers, composites)
  • 3. Physics of surfaces (surface tension, electronics of surfaces, work function, surface states, thermoemission, adsorption, chemisorption, methods for preparation of clean surfaces)
  • 4. Interaction of radiation with materials (effects caused by interaction with photons, electrons, ions)
  • 5. Electron spectroscopy (electron sources, energy analysers, ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy, Auger spectroscopy, spectroscopy of energy losses)
  • 6. Ion beam methods (ion sources, mass analyzers, Rutherford backscattering spectroscopy, elastic recoil detection analysis, nuclear resonance reaction analysis)
Literature
  • FLEWITT, P. E. J. and R. K. WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517. ISBN 0750303204. info
Teaching methods
The course is composed of lectures explaining all the topics in the course syllabus. At the end of the course the students study, as their homework, English scientific papers focused on thin films and surface characterization and make their short oral presentations.
Assessment methods
The course is finished by colloquium. Requirements for gaining the credits:
- read and understand selected scientific paper in English,
- comment and discuss the paper during own oral presentations (can be in Czech).
Language of instruction
English
Follow-Up Courses
Further comments (probably available only in Czech)
Study Materials
The course can also be completed outside the examination period.
The course is taught once in two years.
General note: L.
The course is also listed under the following terms Autumn 1999, Spring 2008 - for the purpose of the accreditation, Autumn 2000, Spring 2002, Autumn 2002, Autumn 2003, Spring 2005, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010, Spring 2012, spring 2012 - acreditation, Spring 2014, Spring 2016, Spring 2020, Spring 2022, Spring 2024.
  • Enrolment Statistics (spring 2018, recent)
  • Permalink: https://is.muni.cz/course/sci/spring2018/F7360