NEUHOLD, Alfred, Stefanie FLADISCHER, Stefan MITSCHE, Heinz-Georg FLESCH, Armin MOSER, Jiří NOVÁK, Detlef M SMILGIES, Elke KRAKER, Bernhard LAMPRECHT, Anja HAASE, Werner GROGGER and Roland RESEL. Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. Journal of Applied Physics. Melville, USA: American Institute of Physics, 2011, vol. 110, No 11, 7 pp. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/1.3667171.
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Basic information
Original name Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study
Authors NEUHOLD, Alfred, Stefanie FLADISCHER, Stefan MITSCHE, Heinz-Georg FLESCH, Armin MOSER, Jiří NOVÁK, Detlef M SMILGIES, Elke KRAKER, Bernhard LAMPRECHT, Anja HAASE, Werner GROGGER and Roland RESEL.
Edition Journal of Applied Physics, Melville, USA, American Institute of Physics, 2011, 0021-8979.
Other information
Original language English
Type of outcome Article in a journal
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 2.168
Doi http://dx.doi.org/10.1063/1.3667171
UT WoS 000298254800175
Changed by Changed by: Mgr. Jiří Novák, Ph.D., učo 23056. Changed: 27/9/2013 11:35.
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