NEUSCHITZER, Markus, Armin MOSER, Alfred NEUHOLD, Johanna KRAXNER, Barbara STADLOBER, Martin OEHZELT, Ingo SALZMANN, Roland RESEL and Jiří NOVÁK. Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment. Journal of Applied Crystallography. MALDEN: WILEY-BLACKWELL, 2012, vol. 45, p. 367-370. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S0021889812000908.
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Basic information
Original name Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment
Authors NEUSCHITZER, Markus, Armin MOSER, Alfred NEUHOLD, Johanna KRAXNER, Barbara STADLOBER, Martin OEHZELT, Ingo SALZMANN, Roland RESEL and Jiří NOVÁK.
Edition Journal of Applied Crystallography, MALDEN, WILEY-BLACKWELL, 2012, 0021-8898.
Other information
Original language English
Type of outcome Article in a journal
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 3.343
Doi http://dx.doi.org/10.1107/S0021889812000908
UT WoS 000302808300029
Changed by Changed by: Mgr. Jiří Novák, Ph.D., učo 23056. Changed: 27/9/2013 11:27.
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