FRANK, Christian, Jiří NOVÁK, Rupak BANERJEE, Alexander GERLACH, Frank SCHREIBER, Alexei VOROBIEV a Stefan KOWARIK. Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering. Physical Review B. Maryland (USA): The American Physical Society, 2014, roč. 90, č. 4, s. "045410-1"-"045410-6", 6 s. ISSN 1098-0121. Dostupné z: https://dx.doi.org/10.1103/PhysRevB.90.045410. |
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@article{1195805, author = {Frank, Christian and Novák, Jiří and Banerjee, Rupak and Gerlach, Alexander and Schreiber, Frank and Vorobiev, Alexei and Kowarik, Stefan}, article_location = {Maryland (USA)}, article_number = {4}, doi = {http://dx.doi.org/10.1103/PhysRevB.90.045410}, keywords = {Thin film growth; organic semiconductors; X-ray scattering; molecular beam deposition}, language = {eng}, issn = {1098-0121}, journal = {Physical Review B}, title = {Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering}, url = {http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410}, volume = {90}, year = {2014} }
TY - JOUR ID - 1195805 AU - Frank, Christian - Novák, Jiří - Banerjee, Rupak - Gerlach, Alexander - Schreiber, Frank - Vorobiev, Alexei - Kowarik, Stefan PY - 2014 TI - Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering JF - Physical Review B VL - 90 IS - 4 SP - "045410-1"-"045410-6" EP - "045410-1"-"045410-6" PB - The American Physical Society SN - 10980121 KW - Thin film growth KW - organic semiconductors KW - X-ray scattering KW - molecular beam deposition UR - http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410 L2 - http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410 N2 - We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules. ER -
FRANK, Christian, Jiří NOVÁK, Rupak BANERJEE, Alexander GERLACH, Frank SCHREIBER, Alexei VOROBIEV a Stefan KOWARIK. Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering. \textit{Physical Review B}. Maryland (USA): The American Physical Society, 2014, roč.~90, č.~4, s.~''045410-1''-''045410-6'', 6 s. ISSN~1098-0121. Dostupné z: https://dx.doi.org/10.1103/PhysRevB.90.045410.
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