| FRANK, Christian, Jiří NOVÁK, Rupak BANERJEE, Alexander GERLACH, Frank SCHREIBER, Alexei VOROBIEV and Stefan KOWARIK. Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering. Physical Review B. Maryland (USA): The American Physical Society, 2014, vol. 90, No 4, p. "045410-1"-"045410-6", 6 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.90.045410. |
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@article{1195805,
author = {Frank, Christian and Novák, Jiří and Banerjee, Rupak and Gerlach, Alexander and Schreiber, Frank and Vorobiev, Alexei and Kowarik, Stefan},
article_location = {Maryland (USA)},
article_number = {4},
doi = {http://dx.doi.org/10.1103/PhysRevB.90.045410},
keywords = {Thin film growth; organic semiconductors; X-ray scattering; molecular beam deposition},
language = {eng},
issn = {1098-0121},
journal = {Physical Review B},
title = {Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering},
url = {http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410},
volume = {90},
year = {2014}
}
TY - JOUR
ID - 1195805
AU - Frank, Christian - Novák, Jiří - Banerjee, Rupak - Gerlach, Alexander - Schreiber, Frank - Vorobiev, Alexei - Kowarik, Stefan
PY - 2014
TI - Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering
JF - Physical Review B
VL - 90
IS - 4
SP - "045410-1"-"045410-6"
EP - "045410-1"-"045410-6"
PB - The American Physical Society
SN - 10980121
KW - Thin film growth
KW - organic semiconductors
KW - X-ray scattering
KW - molecular beam deposition
UR - http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410
L2 - http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410
N2 - We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules.
ER -
FRANK, Christian, Jiří NOVÁK, Rupak BANERJEE, Alexander GERLACH, Frank SCHREIBER, Alexei VOROBIEV and Stefan KOWARIK. Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering. \textit{Physical Review B}. Maryland (USA): The American Physical Society, 2014, vol.~90, No~4, p.~''045410-1''-''045410-6'', 6 pp. ISSN~1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.90.045410.
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