FRANK, C., R. BANERJEE, M. OETTEL, A. GERLACH, Jiří NOVÁK, G. SANTORO and F. SCHREIBER. Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth. Physical Review B. College (USA): American Institute of Physics, 2014, vol. 90, No 20, p. "205401", 10 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.90.205401. |
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@article{1211741, author = {Frank, C. and Banerjee, R. and Oettel, M. and Gerlach, A. and Novák, Jiří and Santoro, G. and Schreiber, F.}, article_location = {College (USA)}, article_number = {20}, doi = {http://dx.doi.org/10.1103/PhysRevB.90.205401}, keywords = {thin film growth; island formation; organic semiconductors; diindenoperylene; grazing incidence small angle x-ray scattering; small-angle scattering theory}, language = {eng}, issn = {1098-0121}, journal = {Physical Review B}, title = {Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth}, url = {http://link.aps.org/doi/10.1103/PhysRevB.90.205401}, volume = {90}, year = {2014} }
TY - JOUR ID - 1211741 AU - Frank, C. - Banerjee, R. - Oettel, M. - Gerlach, A. - Novák, Jiří - Santoro, G. - Schreiber, F. PY - 2014 TI - Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth JF - Physical Review B VL - 90 IS - 20 SP - "205401" EP - "205401" PB - American Institute of Physics SN - 10980121 KW - thin film growth KW - island formation KW - organic semiconductors KW - diindenoperylene KW - grazing incidence small angle x-ray scattering KW - small-angle scattering theory UR - http://link.aps.org/doi/10.1103/PhysRevB.90.205401 L2 - http://link.aps.org/doi/10.1103/PhysRevB.90.205401 N2 - Understanding the growth of organic semiconducting molecules with shape anisotropy is of high relevance to the processing of optoelectronic devices. This work provides insight into the growth of thin films of the prototypical rodlike organic semiconductor diindenoperylene on a microscopic level by analyzing in detail the film morphology. We model our data, which were obtained by high-resolution grazing incidence small-angle x-ray scattering, using a theoretical description from small-angle scattering theory derived for simple liquids. Based on form-factor calculations for different object types, we determine how the island shapes change in the respective layers. Atomic force microscopy measurements approve our findings. ER -
FRANK, C., R. BANERJEE, M. OETTEL, A. GERLACH, Jiří NOVÁK, G. SANTORO and F. SCHREIBER. Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth. \textit{Physical Review B}. College (USA): American Institute of Physics, 2014, vol.~90, No~20, p.~''205401'', 10 pp. ISSN~1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.90.205401.
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