Simulations and surface quality testing of high asymmetry angle
X-ray crystal monochromators for advanced X-ay imaging
applications

D 2014

Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications

ZÁPRAŽNÝ, Z., D. KORYTÁR, P. ŠIFFALOVIČ, M. JERGEL, M. DEMYDENKO et. al.

Basic information

Original name

Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications

Authors

ZÁPRAŽNÝ, Z. (703 Slovakia), D. KORYTÁR (703 Slovakia), P. ŠIFFALOVIČ (703 Slovakia), M. JERGEL (703 Slovakia), M. DEMYDENKO (703 Slovakia), Petr MIKULÍK (643 Russian Federation, guarantor, belonging to the institution), E. DOBROČKA (703 Slovakia), C. FERRARI (380 Italy), P. VAGOVIČ (703 Slovakia) and M. MIKLOŠKA (703 Slovakia)

Edition

9207. vyd. USA, Advances in X-Ray/EUV Optics and Components IX, p. "nestránkováno", 14 pp. 2014

Publisher

SPIE-INT SOC OPTICAL ENGINEERING

Other information

Language

English

Type of outcome

Stať ve sborníku

Field of Study

10302 Condensed matter physics

Country of publisher

United States of America

Confidentiality degree

není předmětem státního či obchodního tajemství

Publication form

printed version "print"

References:

URL

RIV identification code

RIV/00216224:14740/14:00079915

Organization unit

Central European Institute of Technology

ISBN

978-1-62841-234-5

ISSN

DOI

http://dx.doi.org/10.1117/12.2061353

UT WoS

000343877600030

Keywords in English

Crystals ; Monochromators ; Simulations ; Surface quality testing ; X-ray imaging ; X-rays ; Germanium ; Single point diamond turning ; Polishing ; Reflectivity

Abstract

V originále

Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Ge crystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals. The spatial resolution of Ge magnifiers is typically two times better than the spatial resolution of Si magnifiers. We used high asymmetry diffractions to increase effectively the propagation distance and decrease the effective pixel size of the detector, to achieve a sufficient magnification of the sample and to improve coherence and increase output intensity. The most important parameter of a highly asymmetric monochromators as image magnifiers is the crystal surface quality. We have applied several crystal surface finishing methods including conventional mechanical lapping, chemical polishing, chemo-mechanical polishing and advanced nano-machining using single point diamond turning (SPDT), and we have evaluated these methods by means of AFM, diffractometry, reciprocal space mapping and others.

Links

ED1.1.00/02.0068, research and development project

Name: CEITEC - central european institute of technology

Citovat

ZÁPRAŽNÝ, Z., D. KORYTÁR, P. ŠIFFALOVIČ, M. JERGEL, M. DEMYDENKO, Petr MIKULÍK, E. DOBROČKA, C. FERRARI, P. VAGOVIČ and M. MIKLOŠKA. Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications. In C. Morawe, A. Khounsary, and S. Goto. Advances in X-Ray/EUV Optics and Components IX. 9207th ed. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2014, p. "nestránkováno", 14 pp. ISBN 978-1-62841-234-5. Available from: https://dx.doi.org/10.1117/12.2061353.

@inproceedings{1232648,
   author = {Zápražný, Z. and Korytár, D. and Šiffalovič, P. and Jergel, M. and Demydenko, M. and Mikulík, Petr and Dobročka, E. and Ferrari, C. and Vagovič, P. and Mikloška, M.},
   address = {USA},
   booktitle = {Advances in X-Ray/EUV Optics and Components IX},
   doi = {http://dx.doi.org/10.1117/12.2061353},
   edition = {9207},
   editor = {C. Morawe, A. Khounsary, and S. Goto},
   keywords = {Crystals ; Monochromators ; Simulations ; Surface quality testing ; X-ray imaging ; X-rays ; Germanium ; Single point diamond turning ; Polishing ; Reflectivity},
   howpublished = {tištěná verze "print"},
   language = {eng},
   location = {USA},
   isbn = {978-1-62841-234-5},
   pages = {"nestránkováno"},
   publisher = {SPIE-INT SOC OPTICAL ENGINEERING},
   title = {Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications},
   url = {http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541},
   year = {2014}
}

TY  - JOUR
ID  - 1232648
AU  - Zápražný, Z. - Korytár, D. - Šiffalovič, P. - Jergel, M. - Demydenko, M. - Mikulík, Petr - Dobročka, E. - Ferrari, C. - Vagovič, P. - Mikloška, M.
PY  - 2014
TI  - Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications
PB  - SPIE-INT SOC OPTICAL ENGINEERING
CY  - USA
SN  - 9781628412345
KW  - Crystals
KW  - Monochromators
KW  - Simulations
KW  - Surface quality testing
KW  - X-ray imaging
KW  - X-rays
KW  - Germanium
KW  - Single point diamond turning
KW  - Polishing
KW  - Reflectivity
UR  - http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541
L2  - http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541
N2  - Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Ge crystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals. The spatial resolution of Ge magnifiers is typically two times better than the spatial resolution of Si magnifiers. We used high asymmetry diffractions to increase effectively the propagation distance and decrease the effective pixel size of the detector, to achieve a sufficient magnification of the sample and to improve coherence and increase output intensity. The most important parameter of a highly asymmetric monochromators as image magnifiers is the crystal surface quality. We have applied several crystal surface finishing methods including conventional mechanical lapping, chemical polishing, chemo-mechanical polishing and advanced nano-machining using single point diamond turning (SPDT), and we have evaluated these methods by means of AFM, diffractometry, reciprocal space mapping and others.
ER  -

ZÁPRAŽNÝ, Z., D. KORYTÁR, P. ŠIFFALOVIČ, M. JERGEL, M. DEMYDENKO, Petr MIKULÍK, E. DOBROČKA, C. FERRARI, P. VAGOVIČ and M. MIKLOŠKA. Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications. In C. Morawe, A. Khounsary, and S. Goto. \textit{Advances in X-Ray/EUV Optics and Components IX}. 9207th ed. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2014, p.~''nestránkováno'', 14 pp. ISBN~978-1-62841-234-5. Available from: https://dx.doi.org/10.1117/12.2061353.

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