Další formáty:
BibTeX
LaTeX
RIS
@inproceedings{1321666,
author = {Mašová, Šárka and Tihlaříková, Eva and Neděla, Vilém},
address = {USA/UK},
booktitle = {CISCEM 2014 Proceedings of the Second Conference on In situ and Correlative Electron Microscopy, Saarbrucken, Germany, October 14–15, 2014},
doi = {http://dx.doi.org/10.1016/bs.aiep.2015.02.004},
editor = {Niels de Jonge},
keywords = {ESEM; Parasites; Nematoda; Contracaecum osculatum; Acanthocephala; Corynosoma pseudohamanni},
howpublished = {elektronická verze "online"},
language = {eng},
location = {USA/UK},
pages = {92-95},
publisher = {Journal Advances in Imaging and Electron Physics (Elsevier Inc.)},
title = {In Situ Dynamic ESEM Observationsof Basic Groups of Parasites},
url = {http://www.sciencedirect.com/science/article/pii/S1076567015000221},
year = {2015}
}
TY - JOUR
ID - 1321666
AU - Mašová, Šárka - Tihlaříková, Eva - Neděla, Vilém
PY - 2015
TI - In Situ Dynamic ESEM Observationsof Basic Groups of Parasites
PB - Journal Advances in Imaging and Electron Physics (Elsevier Inc.)
CY - USA/UK
KW - ESEM
KW - Parasites
KW - Nematoda
KW - Contracaecum osculatum
KW - Acanthocephala
KW - Corynosoma pseudohamanni
UR - http://www.sciencedirect.com/science/article/pii/S1076567015000221
N2 - Environmental scanning electron microscopy (ESEM) based on new methods (Nedela 2010; Nedela et al., 2015) and instrumentation (Jirak et al., 2010) can be used for the advanced study of parasites in their native state. The aim of this work is to show new results of two groups of helminth parasites (Nematoda, Contracaecum osculatum; and Acanthocephala, Corynosoma pseudohamanni) with minimal shape and volume distortions (keeping them acceptable for taxonomical research) and to emphasize the advantages of dynamical in situ experiments in this field of science.
ER -
MAŠOVÁ, Šárka, Eva TIHLAŘÍKOVÁ a Vilém NEDĚLA. In Situ Dynamic ESEM Observationsof Basic Groups of Parasites. Online. In Niels de Jonge. \textit{CISCEM 2014 Proceedings of the Second Conference on In situ and Correlative Electron Microscopy, Saarbrucken, Germany, October 14–15, 2014}. USA/UK: Journal Advances in Imaging and Electron Physics (Elsevier Inc.), 2015, s.~92-95. ISSN~1076-5670. Dostupné z: https://dx.doi.org/10.1016/bs.aiep.2015.02.004.
|
