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@article{1339762, author = {Bok, Jan and Lalinský, Ondřej and Hanuš, Martin and Kelar, Jakub and Onderišinová, Zuzana and Kučera, Miroslav}, article_number = {April}, doi = {http://dx.doi.org/10.1016/j.ultramic.2016.01.003}, keywords = {Scintillator; GAGG:Ce; Multicomponent garnet; Epitaxial film; Electron detection; SEM}, language = {eng}, issn = {0304-3991}, journal = {Ultramicroscopy}, title = {GAGG:Ce single crystalline films: New perspective scintillators for electron detection in SEM.}, url = {http://www.sciencedirect.com/science/article/pii/S0304399116300031}, volume = {163}, year = {2016} }
TY - JOUR ID - 1339762 AU - Bok, Jan - Lalinský, Ondřej - Hanuš, Martin - Kelar, Jakub - Onderišinová, Zuzana - Kučera, Miroslav PY - 2016 TI - GAGG:Ce single crystalline films: New perspective scintillators for electron detection in SEM. JF - Ultramicroscopy VL - 163 IS - April SP - 1-5 EP - 1-5 SN - 03043991 KW - Scintillator KW - GAGG:Ce KW - Multicomponent garnet KW - Epitaxial film KW - Electron detection KW - SEM UR - http://www.sciencedirect.com/science/article/pii/S0304399116300031 N2 - Single crystal scintillators are frequently used for electron detection in scanning electron microscopy (SEM). We report gadolinium aluminum gallium garnet (GAGG:Ce) single crystalline films as a new perspective scintillators for the SEM. For the first time, the epitaxial garnet films were used in a practical application: the GAGG:Ce scintillator was incorporated into a SEM scintillation electron detector and it showed improved image quality. In order to prove the GAGG:Ce quality accurately, the scintillation properties were examined using electron beam excitation and compared with frequently used scintillators in the SEM. The results demonstrate excellent emission efficiency of the GAGG:Ce single crystalline films together with their very fast scintillation decay useful for demanding SEM applications. ER -
BOK, Jan, Ondřej LALINSKÝ, Martin HANUŠ, Jakub KELAR, Zuzana ONDERIŠINOVÁ and Miroslav KUČERA. GAGG:Ce single crystalline films: New perspective scintillators for electron detection in SEM. \textit{Ultramicroscopy}. vol.~163, April, p.~1-5. ISSN~0304-3991. doi:10.1016/j.ultramic.2016.01.003. 2016.
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