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@inproceedings{1376068,
author = {Obrusník, Adam and Bonaventura, Zdeněk},
address = {Brno},
booktitle = {International Symposium on High Pressure Low Temperature Plasma Chemistry},
editor = {Mirko Černák, Tomáš Hoder},
keywords = {helium APPJ; reaction kinetics; reaction scheme; elementary effects method},
howpublished = {tištěná verze "print"},
language = {eng},
location = {Brno},
isbn = {978-80-210-8318-9},
pages = {433-435},
publisher = {MASARYKOVA UNIV, ZEROTINOVO NAM 9, BRNO 601 77, CZECH REPUBLIC},
title = {OPTIMIZATION OF KINETIC SCHEMES FOR HELIUM APPJs WITH HUMID AIR IMPURITY FOR TWO-DIMENSIONAL FLUID MODELS USING THE ELEMENTARY EFFECTS METHOD},
year = {2016}
}
TY - JOUR
ID - 1376068
AU - Obrusník, Adam - Bonaventura, Zdeněk
PY - 2016
TI - OPTIMIZATION OF KINETIC SCHEMES FOR HELIUM APPJs WITH HUMID AIR IMPURITY FOR TWO-DIMENSIONAL FLUID MODELS USING THE ELEMENTARY EFFECTS METHOD
PB - MASARYKOVA UNIV, ZEROTINOVO NAM 9, BRNO 601 77, CZECH REPUBLIC
CY - Brno
SN - 9788021083189
KW - helium APPJ
KW - reaction kinetics
KW - reaction scheme
KW - elementary effects method
N2 - This contribution focuses on simplification of a reaction scheme for atmospheric pressure plasmas using the elementary effects method which is well established in various fields. The aim is, first of all, to reduce the number of species that have to be included in the model and secondly to reduce the number of reactions by neglecting reactions that are comparably slower in the relevant range of conditions. Such reaction schemes should then enable development of 2D or 3D fluid models of plasma chemistry, which would otherwise be too computationally expensive.
ER -
OBRUSNÍK, Adam and Zdeněk BONAVENTURA. OPTIMIZATION OF KINETIC SCHEMES FOR HELIUM APPJs WITH HUMID AIR IMPURITY FOR TWO-DIMENSIONAL FLUID MODELS USING THE ELEMENTARY EFFECTS METHOD. In Mirko Černák, Tomáš Hoder. \textit{International Symposium on High Pressure Low Temperature Plasma Chemistry}. Brno: MASARYKOVA UNIV, ZEROTINOVO NAM 9, BRNO 601 77, CZECH REPUBLIC, 2016, p.~433-435. ISBN~978-80-210-8318-9.
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