J 2012

Sample Preparation Induced Artifacts in Cryo-Electron Tomographs

PLEVKA, Pavel, Anthony J. BATTISTI, Dennis C. WINKLER, Kaspars TARS, Heather A. HOLDAWAY et. al.

Basic information

Original name

Sample Preparation Induced Artifacts in Cryo-Electron Tomographs

Authors

PLEVKA, Pavel, Anthony J. BATTISTI, Dennis C. WINKLER, Kaspars TARS, Heather A. HOLDAWAY, Carol M. BATOR and Michael G. ROSSMANN

Edition

Microscopy and Microanalysis, Saarbrücken, Cambridge University Press, 2012, 1431-9276

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10600 1.6 Biological sciences

Country of publisher

United States of America

Confidentiality degree

není předmětem státního či obchodního tajemství

Impact factor

Impact factor: 2.495

Organization unit

Central European Institute of Technology

DOI

UT WoS

000310323400013

Keywords in English

cryo-EM; microscopy; ice-vacuum interface; artifacts; virus; tomography

Tags

Změněno: 29/3/2017 14:13, Mgr. Eva Špillingová

Abstract

V originále

We investigated the effects of sample preparation and of the exposure to an electron beam on particles in cryo-electron tomographs. Various virus particles with icosahedral symmetry were examined, allowing a comparison of symmetrically related components that should be identical in structure but might be affected differently by these imaging artifacts. Comparison of tomographic reconstructions with previously determined structures established by an independent method showed that neither freezing nor electron beam exposure produced a significant amount of shrinkage along the z axis (thickness). However, we observed damage to regions of the particles located close to the surface of the vitreous ice.