J 2017

XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach

MANAKHOV, Anton, Miroslav MICHLÍČEK, Alexandre FELTEN, Jean-Jacques PIREAUX, David NEČAS et. al.

Basic information

Original name

XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach

Authors

MANAKHOV, Anton (643 Russian Federation, belonging to the institution), Miroslav MICHLÍČEK (203 Czech Republic, belonging to the institution), Alexandre FELTEN (56 Belgium), Jean-Jacques PIREAUX (56 Belgium), David NEČAS (203 Czech Republic, belonging to the institution) and Lenka ZAJÍČKOVÁ (203 Czech Republic, guarantor, belonging to the institution)

Edition

Applied Surface Science, AMSTERDAM, ELSEVIER SCIENCE BV, 2017, 0169-4332

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10403 Physical chemistry

Country of publisher

Netherlands

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

Impact factor

Impact factor: 4.439

RIV identification code

RIV/00216224:14740/17:00097541

Organization unit

Central European Institute of Technology

UT WoS

000389152900067

Keywords in English

XPS depth profiling; Surface reactions; Amine derivatization; TFBA; Plasma polymers

Tags

Tags

International impact, Reviewed
Změněno: 21/3/2018 10:53, Mgr. David Nečas, Ph.D.

Abstract

V originále

The quantitative analysis of the chemistry at the surface of functional plasma polymers is highly important for the optimization of their deposition conditions and, therefore, for their subsequent applications. The chemical derivatization of amine and carboxyl-anhydride layers is a well-known technique already applied by many researchers, notwithstanding the known drawback of the derivatization procedures like side or uncomplete reactions that could lead to "unreliable" results. In this work, X-ray photoelectron spectroscopy (XPS) combined with depth profiling with argon clusters is applied for the first time to study derivatized amine and carboxyl-anhydride plasma polymer layers. It revealed an additional important parameter affecting the derivatization reliability, namely the permeation of the derivatizing molecule through the target analysed layer, i.e. the composite effect of the probe molecule size and the layer porosity. Amine-rich films prepared by RF low pressure plasma polymerization of cyclopropylamine were derivatized with trifluoromethyl benzaldehide (TFBA) and it was observed by that the XPS-determined NH2 concentration depth profile is rapidly decreasing over top ten nanometers of the layer. The anhydride-rich films prepared by atmospheric plasma co-polymerization of maleic anhydride and C2H2 have been reacted with, parafluoroaniline and trifluoroethyl amine. The decrease of the F signal in top surface layer of the anhydride films derivatized by the "large" parafluoroaniline was observed similarly as for the amine films but the derivatization with the smaller trifluoroethylamine (TFEA) led to a more homogenous depth profile. The data analysis suggests that the size of the derivatizing molecule is the main factor, showing that the very limited permeation of the TFBA molecule can lead to underestimated densities of primary amines if the XPS analysis is solely carried out at a low take-off angle. In contrast, TFEA is found to be an efficient derivatization agent of anhydride groups with high permeability through the carboxyl-anhydride layer. (C) 2016 Elsevier B.V. All rights reserved.

Links

LQ1601, research and development project
Name: CEITEC 2020 (Acronym: CEITEC2020)
Investor: Ministry of Education, Youth and Sports of the CR