Detailed Information on Publication Record
2017
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach
MANAKHOV, Anton, Miroslav MICHLÍČEK, Alexandre FELTEN, Jean-Jacques PIREAUX, David NEČAS et. al.Basic information
Original name
XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach
Authors
MANAKHOV, Anton (643 Russian Federation, belonging to the institution), Miroslav MICHLÍČEK (203 Czech Republic, belonging to the institution), Alexandre FELTEN (56 Belgium), Jean-Jacques PIREAUX (56 Belgium), David NEČAS (203 Czech Republic, belonging to the institution) and Lenka ZAJÍČKOVÁ (203 Czech Republic, guarantor, belonging to the institution)
Edition
Applied Surface Science, AMSTERDAM, ELSEVIER SCIENCE BV, 2017, 0169-4332
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10403 Physical chemistry
Country of publisher
Netherlands
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 4.439
RIV identification code
RIV/00216224:14740/17:00097541
Organization unit
Central European Institute of Technology
UT WoS
000389152900067
Keywords in English
XPS depth profiling; Surface reactions; Amine derivatization; TFBA; Plasma polymers
Tags
Tags
International impact, Reviewed
Změněno: 21/3/2018 10:53, Mgr. David Nečas, Ph.D.
Abstract
V originále
The quantitative analysis of the chemistry at the surface of functional plasma polymers is highly important for the optimization of their deposition conditions and, therefore, for their subsequent applications. The chemical derivatization of amine and carboxyl-anhydride layers is a well-known technique already applied by many researchers, notwithstanding the known drawback of the derivatization procedures like side or uncomplete reactions that could lead to "unreliable" results. In this work, X-ray photoelectron spectroscopy (XPS) combined with depth profiling with argon clusters is applied for the first time to study derivatized amine and carboxyl-anhydride plasma polymer layers. It revealed an additional important parameter affecting the derivatization reliability, namely the permeation of the derivatizing molecule through the target analysed layer, i.e. the composite effect of the probe molecule size and the layer porosity. Amine-rich films prepared by RF low pressure plasma polymerization of cyclopropylamine were derivatized with trifluoromethyl benzaldehide (TFBA) and it was observed by that the XPS-determined NH2 concentration depth profile is rapidly decreasing over top ten nanometers of the layer. The anhydride-rich films prepared by atmospheric plasma co-polymerization of maleic anhydride and C2H2 have been reacted with, parafluoroaniline and trifluoroethyl amine. The decrease of the F signal in top surface layer of the anhydride films derivatized by the "large" parafluoroaniline was observed similarly as for the amine films but the derivatization with the smaller trifluoroethylamine (TFEA) led to a more homogenous depth profile. The data analysis suggests that the size of the derivatizing molecule is the main factor, showing that the very limited permeation of the TFBA molecule can lead to underestimated densities of primary amines if the XPS analysis is solely carried out at a low take-off angle. In contrast, TFEA is found to be an efficient derivatization agent of anhydride groups with high permeability through the carboxyl-anhydride layer. (C) 2016 Elsevier B.V. All rights reserved.
Links
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