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@article{1390058,
author = {Friš, Pavel and Dubroka, Adam},
article_location = {AMSTERDAM},
article_number = {November},
doi = {http://dx.doi.org/10.1016/j.apsusc.2016.10.125},
keywords = {Far infrared ellipsometry; Phonons; SrTiO3;},
language = {eng},
issn = {0169-4332},
journal = {Applied Surface Science},
title = {Vacuum variable-angle far-infrared ellipsometer},
volume = {421},
year = {2017}
}
TY - JOUR
ID - 1390058
AU - Friš, Pavel - Dubroka, Adam
PY - 2017
TI - Vacuum variable-angle far-infrared ellipsometer
JF - Applied Surface Science
VL - 421
IS - November
SP - 430-434
EP - 430-434
PB - ELSEVIER SCIENCE
SN - 01694332
KW - Far infrared ellipsometry
KW - Phonons
KW - SrTiO3;
N2 - We present the design and performance of a vacuum far-infrared (similar to 50-680 cm(-1)) ellipsometer witha rotating analyser. The system is based on a Fourier transform spectrometer, an in-house built ellipsometer chamber and a closed-cycle bolometer. The ellipsometer chamber is equipped with a computer controlled theta-2 theta goniometer for automated measurements at various angles of incidence. We compare our measurements on SrTiO3 crystal with the results acquired above 300 cm(-1) with a commercially available ellipsometer system. After the calibration of the angle of incidence and after taking into account the finite reflectivity of mirrors in the detector part we obtain a very good agreement between the data from the two instruments. The system can be supplemented with a closed-cycle He cryostat for measurements between 5 and 400 K. (C) 2016 Published by Elsevier B.V.
ER -
FRIŠ, Pavel and Adam DUBROKA. Vacuum variable-angle far-infrared ellipsometer. \textit{Applied Surface Science}. AMSTERDAM: ELSEVIER SCIENCE, 2017, vol.~421, November, p.~430-434. ISSN~0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.10.125.
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