Detailed Information on Publication Record
2017
Vacuum variable-angle far-infrared ellipsometer
FRIŠ, Pavel and Adam DUBROKABasic information
Original name
Vacuum variable-angle far-infrared ellipsometer
Authors
FRIŠ, Pavel (203 Czech Republic, belonging to the institution) and Adam DUBROKA (203 Czech Republic, guarantor, belonging to the institution)
Edition
Applied Surface Science, AMSTERDAM, ELSEVIER SCIENCE, 2017, 0169-4332
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
Netherlands
Confidentiality degree
není předmětem státního či obchodního tajemství
Impact factor
Impact factor: 4.439
RIV identification code
RIV/00216224:14310/17:00097620
Organization unit
Faculty of Science
UT WoS
000408756700026
Keywords in English
Far infrared ellipsometry; Phonons; SrTiO3;
Tags
International impact, Reviewed
Změněno: 12/4/2018 18:21, Ing. Nicole Zrilić
Abstract
V originále
We present the design and performance of a vacuum far-infrared (similar to 50-680 cm(-1)) ellipsometer witha rotating analyser. The system is based on a Fourier transform spectrometer, an in-house built ellipsometer chamber and a closed-cycle bolometer. The ellipsometer chamber is equipped with a computer controlled theta-2 theta goniometer for automated measurements at various angles of incidence. We compare our measurements on SrTiO3 crystal with the results acquired above 300 cm(-1) with a commercially available ellipsometer system. After the calibration of the angle of incidence and after taking into account the finite reflectivity of mirrors in the detector part we obtain a very good agreement between the data from the two instruments. The system can be supplemented with a closed-cycle He cryostat for measurements between 5 and 400 K. (C) 2016 Published by Elsevier B.V.
Links
| LQ1601, research and development project |
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