Detailed Information on Publication Record
2017
Growth, Structure, and Anisotropic Optical Properties of Difluoro-anthradithiophene Thin Films
STORZER, Timo, Alexander HINDERHOFER, Clemens ZEISER, Jiří NOVÁK, Zbyněk FIŠER et. al.Basic information
Original name
Growth, Structure, and Anisotropic Optical Properties of Difluoro-anthradithiophene Thin Films
Authors
STORZER, Timo (276 Germany), Alexander HINDERHOFER (276 Germany), Clemens ZEISER (276 Germany), Jiří NOVÁK (203 Czech Republic, belonging to the institution), Zbyněk FIŠER (203 Czech Republic, belonging to the institution), Valentina BELOVA (643 Russian Federation), Berthold REISZ (276 Germany), Santanu MAITI (356 India), Giuliano DUVA (380 Italy), Rawad K. HALLANI (840 United States of America), Alexander GERLACH (276 Germany), John E. ANTHONY (840 United States of America) and Frank SCHREIBER (276 Germany)
Edition
Journal of Physical Chemistry C, Washington D.C. American Chemical Soc, 2017, 1932-7447
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
United States of America
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 4.484
RIV identification code
RIV/00216224:14310/17:00098473
Organization unit
Faculty of Science
UT WoS
000412150500053
Keywords in English
organic semiconductors; structural properties; optical properties; thin films; x-ray diffraction;
Tags
International impact, Reviewed
Změněno: 11/9/2018 11:36, Mgr. Jiří Novák, Ph.D.
Abstract
V originále
Anthradithiophene (ADT) and its functionalized derivatives have proven to be attractive for high-performance electronic devices based on small-molecule organic semiconductors. In this manuscript we investigate the structural and optical properties of thin films of difluoro-anthradithiophene (diF-ADT), an ADT derivative, grown by organic molecular beam deposition (OMBD). By grazing incidence X-ray diffraction and reciprocal space maps, we show that diF-ADT crystallizes in a thin film structure similar to the single crystal unit cell. In addition, we investigate the growth characteristics with atomic force microscopy (AFM) and show an increase of surface mound sizes with elevated substrate temperature. Optical absorption measurements reveal a clear vibronic progression in both solution and thin film spectra along with a distinct optical anisotropy related to the molecular orientation in thin films.
Links
LM2015041, research and development project |
| ||
LQ1601, research and development project |
| ||
7AMB16DE006, research and development project |
|