MEDUŇA, Mojmír, Fabio ISA, Arik JUNG, Anna MARZEGALLI, Marco ALBANI, Giovanni ISELLA, Kai ZWEIACKER, Leo MIGLIO and Hans VON KÄNEL. Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2018, vol. 51, No 2, p. 368-385. ISSN 1600-5767. Available from: https://dx.doi.org/10.1107/S1600576718001450.
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Basic information
Original name Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals
Name in Czech Mřížkový sklon a deformace mapované rtg skenováním pomocí nanodifrakce v kompozičně gradovaných SiGe/ Si mikrokrystalech
Authors MEDUŇA, Mojmír (203 Czech Republic, guarantor, belonging to the institution), Fabio ISA (380 Italy), Arik JUNG (756 Switzerland), Anna MARZEGALLI (380 Italy), Marco ALBANI (380 Italy), Giovanni ISELLA (380 Italy), Kai ZWEIACKER (756 Switzerland), Leo MIGLIO (380 Italy) and Hans VON KÄNEL (756 Switzerland).
Edition Journal of Applied Crystallography, Chester, INT UNION CRYSTALLOGRAPHY, 2018, 1600-5767.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 2.867
RIV identification code RIV/00216224:14310/18:00102267
Organization unit Faculty of Science
Doi http://dx.doi.org/10.1107/S1600576718001450
UT WoS 000429090100016
Keywords (in Czech) skenovací rentgenová nanodifrakce; prohnutí mřížky; gradované mikrokrystaly SiGe; uvolnění pnutí
Keywords in English scanning X-ray nanodiffraction; lattice bending; graded SiGe microcrystals; strain relaxation
Tags rivok
Tags International impact, Reviewed
Changed by Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 10/1/2019 11:07.
Abstract
The scanning X-ray nanodiffraction technique is used to reconstruct the three- dimensional (3D) distribution of lattice strain and Ge concentration in compositionally graded Si1-xGex microcrystals epitaxially grown on Si pillars.
Abstract (in Czech)
Skenovací rentgenová nanodifrační technika se používá k rekonstrukci třírozměrné (3D) distribuce mřížové deformace a koncentrace Ge v kompozičně gradovaných mikrokrystalech Si1-xGex epitaxiálně rostlých na pilířích Si.
Links
CZ.02.1.01/0.0/0.0/16_013/0001728, interní kód MUName: CEITEC Nano+ (Acronym: CEITEC Nano)
Investor: Ministry of Education, Youth and Sports of the CR, CEITEC Nano+ (CEITEC Nano), Priority axis 1: Strengthening capacities for high-quality research
ED1.1.00/02.0068, research and development projectName: CEITEC - central european institute of technology
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