KOBAYASHI, Eiji, Mathieu BOCCARD, Quentin JEANGROS, Nathan RODKEY, Daniel VRESILOVIC, Aïcha HESSLER-WYSER, Max DÖBELI, Daniel FRANTA, Stefaan DE WOLF, Monica MORALES-MASIS and Christophe BALLIF. Amorphous gallium oxide grown by low-temperature PECVD. Journal of Vacuum Science and Technology A. AIP, 2018, vol. 36, No 2, p. 1-7. ISSN 0734-2101. Available from: https://dx.doi.org/10.1116/1.5018800.
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Basic information
Original name Amorphous gallium oxide grown by low-temperature PECVD
Authors KOBAYASHI, Eiji, Mathieu BOCCARD, Quentin JEANGROS, Nathan RODKEY, Daniel VRESILOVIC, Aïcha HESSLER-WYSER, Max DÖBELI, Daniel FRANTA (203 Czech Republic, guarantor, belonging to the institution), Stefaan DE WOLF, Monica MORALES-MASIS and Christophe BALLIF.
Edition Journal of Vacuum Science and Technology A, AIP, 2018, 0734-2101.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United States of America
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 1.833
RIV identification code RIV/00216224:14310/18:00102357
Organization unit Faculty of Science
Doi http://dx.doi.org/10.1116/1.5018800
UT WoS 000426978500043
Keywords in English Chemical compounds; Optical properties; Thin films; Electron energy loss spectroscopy; Physics of gases
Tags Reviewed
Changed by Changed by: Mgr. Michal Petr, učo 65024. Changed: 23/4/2024 11:04.
Abstract
Owing to the wide application of metal oxides in energy conversion devices, the fabrication of these oxides using conventional, damage-free, and upscalable techniques is of critical importance in the optoelectronics community. Here, theauthors demonstrate the growth of hydrogenated amorphous gallium oxide (a-GaOx:H) thin-films by plasma-enhanced chemical vapor deposition (PECVD) at temperatures below 200°C. In this way, conformal films are deposited at high deposition rates, achieving high broadband transparency, wide band gap (3.5-4 eV), and low refractive index (1.6 at 500 nm). The authors link this low refractive index to the presence of nanoscale voids enclosing H2, as indicated by electron energy-loss spectroscopy. This work opens the path for further metal-oxide developments by low-temperature, scalable and damage-free PECVD processes.
Links
LO1411, research and development projectName: Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy (Acronym: CEPLANT plus)
Investor: Ministry of Education, Youth and Sports of the CR
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