SCHÄFER, Jan, Katja FRICKE, František MIKA, Zuzana POKORNÁ, Lenka ZAJÍČKOVÁ and Rudiger FOEST. Liquid assisted plasma enhanced chemical vapour deposition with a non-thermal plasma jet at atmospheric pressure. Thin Solid Films. Lausanne: Elsevier science, 2017, vol. 630, MAY, p. 71-78. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2016.09.022.
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Basic information
Original name Liquid assisted plasma enhanced chemical vapour deposition with a non-thermal plasma jet at atmospheric pressure
Authors SCHÄFER, Jan (203 Czech Republic), Katja FRICKE (276 Germany), František MIKA (203 Czech Republic), Zuzana POKORNÁ (203 Czech Republic), Lenka ZAJÍČKOVÁ (203 Czech Republic, guarantor, belonging to the institution) and Rudiger FOEST (276 Germany).
Edition Thin Solid Films, Lausanne, Elsevier science, 2017, 0040-6090.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10305 Fluids and plasma physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 1.939
RIV identification code RIV/00216224:14740/17:00100437
Organization unit Central European Institute of Technology
Doi http://dx.doi.org/10.1016/j.tsf.2016.09.022
UT WoS 000401080700010
Keywords in English Plasma jet; Liquid assisted plasma enhanced chemical vapour deposition; Silicon oxide; Hexamethyldisiloxane; Octamethyltetrasiloxane; Tetrakis(trimethylsilyloxy)silane
Tags OA, rivok
Tags International impact, Reviewed
Changed by Changed by: Mgr. Pavla Foltynová, Ph.D., učo 106624. Changed: 21/3/2018 10:03.
Abstract
The present study introduces a process for the synthesis of functional films onto substrates directly from the liquid phase. The reported method is based on the initialization of the synthesis by means of an atmospheric pressure plasma jet operating with argon above a thin liquid film of the starting material. The process is demonstrated by the formation of a thin, solid SiOx film from siloxane-based liquid precursors. Changes in the chemical properties of the precursor were studied in-situ during the polymerization process on the diamond crystal by using Fourier transform infrared spectroscopy The elemental composition of the SiOxCy films was analyzed by X-ray photoelectron spectroscopy (XPS). Furthermore, XPS was applied to study the effect of post-annealing processes on the composition of the films. The obtained deposits exhibit a low concentration of carbon groups. The amount of hydroxyl groups and interstitial water can be reduced significantly by post-process annealing of the films. (C) 2016 The Author(s). Published by Elsevier B.V.
Links
LQ1601, research and development projectName: CEITEC 2020 (Acronym: CEITEC2020)
Investor: Ministry of Education, Youth and Sports of the CR
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