| ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL and Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics. Taylor & Francis, 2018, vol. 65, No 14, p. 1720-1736. ISSN 0950-0340. Available from: https://dx.doi.org/10.1080/09500340.2018.1457187. |
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@article{1434656,
author = {Čermák, Martin and Vohánka, Jiří and Ohlídal, Ivan and Franta, Daniel},
article_number = {14},
doi = {http://dx.doi.org/10.1080/09500340.2018.1457187},
keywords = {Multilayer systems; rough boundaries; ellipsometric parameters; reflectance; transmittance},
language = {eng},
issn = {0950-0340},
journal = {Journal of modern optics},
title = {Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory},
url = {https://www.tandfonline.com/doi/full/10.1080/09500340.2018.1457187},
volume = {65},
year = {2018}
}
TY - JOUR
ID - 1434656
AU - Čermák, Martin - Vohánka, Jiří - Ohlídal, Ivan - Franta, Daniel
PY - 2018
TI - Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
JF - Journal of modern optics
VL - 65
IS - 14
SP - 1720-1736
EP - 1720-1736
PB - Taylor & Francis
SN - 09500340
KW - Multilayer systems
KW - rough boundaries
KW - ellipsometric parameters
KW - reflectance
KW - transmittance
UR - https://www.tandfonline.com/doi/full/10.1080/09500340.2018.1457187
L2 - https://www.tandfonline.com/doi/full/10.1080/09500340.2018.1457187
N2 - In this paper the exact approach of the Rayleigh–Rice theory enabling us to calculate optical quantities of multi-layer systems with boundaries exhibiting slight random roughness is presented. This approach is exact in the sense that it takes into account the propagation of perturbed electromagnetic fields (waves) among randomly rough boundaries including all cross-correlation and auto-correlation effects. The restriction to the second order of perturbation, which is the lowest order that gives nonzero corrections to coherent waves (obeying the Snell’s law), represents the only approximation used in our calculations. It is assumed that the layers and the substrates are formed by optically homogeneous and isotropic materials. The formulae obtained in the theoretical part are used to investigate the influence of layer thicknesses and roughness parameters on reflectances and associated ellipsometric parameters of the selected numerical examples of a three-layer system. The presented approach represents the generalization of the exact approach for single-layer systems and the improvement of the approximate approach for multi-layer systems published earlier. The exact approach of the RRT has a substantial importance for the optical characterization of multi-layer systems occurring in applied research and optics industry applications.
ER -
ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL and Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. \textit{Journal of modern optics}. Taylor \&{} Francis, 2018, vol.~65, No~14, p.~1720-1736. ISSN~0950-0340. Available from: https://dx.doi.org/10.1080/09500340.2018.1457187.
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