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@inbook{1472962,
author = {Ohlídal, Ivan and Vohánka, Jiří and Čermák, Martin and Franta, Daniel},
address = {Cham},
booktitle = {Optical Characterization of Thin Solid Films},
doi = {http://dx.doi.org/10.1007/978-3-319-75325-6_9},
editor = {Olaf Stenzel, Miloslav Ohlídal},
keywords = {Layered systems;Jones formalism;Stokes–Mueller formalism;Yeh formalism;Ellipsometry;Ellipsometric techniques},
howpublished = {tištěná verze "print"},
language = {eng},
location = {Cham},
isbn = {978-3-319-75324-9},
pages = {233-267},
publisher = {Springer},
title = {Ellipsometry of Layered Systems},
url = {https://link.springer.com/chapter/10.1007/978-3-319-75325-6_9},
year = {2018}
}
TY - CHAP
ID - 1472962
AU - Ohlídal, Ivan - Vohánka, Jiří - Čermák, Martin - Franta, Daniel
PY - 2018
TI - Ellipsometry of Layered Systems
VL - Springer Series in Surface Sciences, volume 64
PB - Springer
CY - Cham
SN - 9783319753249
KW - Layered systems;Jones formalism;Stokes–Mueller formalism;Yeh formalism;Ellipsometry;Ellipsometric techniques
UR - https://link.springer.com/chapter/10.1007/978-3-319-75325-6_9
L2 - https://link.springer.com/chapter/10.1007/978-3-319-75325-6_9
N2 - In this chapter the theoretical aspects of ellipsometry and their applications in optics of layered systems are presented. The basic formulae of the theory of ellipsometric measurements are introduced. For this purpose the Jones and Stokes--Mueller matrix formalisms are used. By using these formalisms the individual types of ellipsometry and the most utilized ellipsometric techniques are briefly described. Furthermore, the matrix formalisms enabling us to derive the formulae for the optical quantities of optically isotropic and anisotropic layered systems are described as well. Applications of the matrix formalisms in practice are illustrated by means of three examples.
ER -
OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. \textit{Optical Characterization of Thin Solid Films}. Cham: Springer, 2018, s.~233-267. Springer Series in Surface Sciences, volume 64. ISBN~978-3-319-75324-9. Dostupné z: https://dx.doi.org/10.1007/978-3-319-75325-6\_{}9.
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