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@inbook{1472965,
author = {Franta, Daniel and Vohánka, Jiří and Čermák, Martin},
address = {Cham},
booktitle = {Optical Characterization of Thin Solid Films},
doi = {http://dx.doi.org/10.1007/978-3-319-75325-6_3},
editor = {Olaf Stenzel, Miloslav Ohlídal},
keywords = {Dispersion models;Dielectric response;Damped harmonic oscillators;Coupled modes;Parametrization of the joint density of states},
howpublished = {tištěná verze "print"},
language = {eng},
location = {Cham},
isbn = {978-3-319-75324-9},
pages = {31-82},
publisher = {Springer},
title = {Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range},
url = {https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3},
year = {2018}
}
TY - CHAP
ID - 1472965
AU - Franta, Daniel - Vohánka, Jiří - Čermák, Martin
PY - 2018
TI - Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
VL - Springer Series in Surface Sciences, volume 64
PB - Springer
CY - Cham
SN - 9783319753249
KW - Dispersion models;Dielectric response;Damped harmonic oscillators;Coupled modes;Parametrization of the joint density of states
UR - https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3
L2 - https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3
N2 - The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers--Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.
ER -
FRANTA, Daniel, Jiří VOHÁNKA and Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. \textit{Optical Characterization of Thin Solid Films}. Cham: Springer, 2018, p.~31-82. Springer Series in Surface Sciences, volume 64. ISBN~978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6\_{}3.
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