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@article{1548639, author = {MRAZEK, Vojtech and Sekanina, Lukas and Dobai, Roland and Sýs, Marek and Švenda, Petr}, article_number = {12}, doi = {http://dx.doi.org/10.1109/TVLSI.2019.2923848}, keywords = {Testing; Cryptography; Field programmable gate arrays; Hardware; System-on-chip; Generators; Machine learning}, language = {eng}, issn = {1063-8210}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, title = {Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques.}, url = {http://dx.doi.org/10.1109/TVLSI.2019.2923848}, volume = {27}, year = {2019} }
TY - JOUR ID - 1548639 AU - MRAZEK, Vojtech - Sekanina, Lukas - Dobai, Roland - Sýs, Marek - Švenda, Petr PY - 2019 TI - Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques. JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems VL - 27 IS - 12 SP - 2734-2744 EP - 2734-2744 PB - IEEE SN - 10638210 KW - Testing KW - Cryptography KW - Field programmable gate arrays KW - Hardware KW - System-on-chip KW - Generators KW - Machine learning UR - http://dx.doi.org/10.1109/TVLSI.2019.2923848 L2 - http://dx.doi.org/10.1109/TVLSI.2019.2923848 N2 - Randomness testing is an important procedure that bit streams, produced by critical cryptographic primitives such as encryption functions and hash functions, have to undergo. In this paper, a new hardware platform for the randomness testing is proposed. The platform exploits the principles of genetic programming, which is a machine learning technique developed for the automated program and circuit design. The platform is capable of evolving efficient randomness distinguishers directly on a chip. Each distinguisher is represented as a Boolean polynomial in the algebraic normal form. The randomness testing is conducted for bit streams that are either stored in an on-chip memory or generated by a circuit placed on the chip. The platform is developed with a Xilinx Zynq-7000 All Programmable System on Chip that integrates a field programmable gate array with on-chip ARM processors. The platform is evaluated in terms of the quality of randomness testing, performance, and resources utilization. With power budget less than 3 W, the platform provides comparable randomness testing capabilities with the standard testing batteries running on a personal computer. ER -
MRAZEK, Vojtech, Lukas SEKANINA, Roland DOBAI, Marek SÝS a Petr ŠVENDA. Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques. \textit{IEEE Transactions on Very Large Scale Integration (VLSI) Systems}. IEEE, 2019, roč.~27, č.~12, s.~2734-2744. ISSN~1063-8210. Dostupné z: https://dx.doi.org/10.1109/TVLSI.2019.2923848.
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