Detailed Information on Publication Record
2019
Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS
KASPAR, P., D. SOBOLA, R. DALLAEV, S. RAMAZANOV, Alois NEBOJSA et. al.Basic information
Original name
Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS
Authors
KASPAR, P. (guarantor), D. SOBOLA, R. DALLAEV, S. RAMAZANOV, Alois NEBOJSA (203 Czech Republic, belonging to the institution), S. REZAEE and L. GRMELA
Edition
Applied Surface Science, AMSTERDAM, Elsevier Science BV, 2019, 0169-4332
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
Netherlands
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 6.182
RIV identification code
RIV/00216224:14310/19:00113443
Organization unit
Faculty of Science
UT WoS
000502007800013
Keywords in English
Graphite; Fe2O3; Ellipsometry; XPS; AFM
Tags
Změněno: 1/4/2020 11:20, Mgr. Marie Šípková, DiS.
Abstract
V originále
Graphite finds use in a large amount of nanoscale applications, including as a substrate for thin film and nanomaterial deposition. With its excellent properties for usage in nanoscale and given the regularity of structure of highly oriented pyrolytic graphite (HOPG), the possibility of use to acquire more precise and detailed results is high. To this end the basic topographical and structural properties of HOPG and thin Fe2O3 have been explored. Methods used were atomic force microscopy, ellipsometry and x-ray photoelectron spectroscopy. Documentation of the results allows for further examination of HOPG usage possibilities, uncoated or coated with Fe2O3 thin film, as well as a substrate for carbon fiber or nanotube growth in future projects.
Links
LQ1601, research and development project |
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