SALAJKOVÁ, Zita, Markéta HOLÁ, David PROCHÁZKA, Jakub ONDRÁČEK, David PAVLIŇÁK, Ladislav ČELKO, Filip GREGAR, Petr ŠPERKA, Pavel POŘÍZKA, Viktor KANICKÝ, Alessandro DE GIACOMO and Jozef KAISER. Influence of sample surface topography on laser ablation process. Talanta. Amsterdam: Elsevier, 2021, vol. 222, January 2021, p. 1-9. ISSN 0039-9140. Available from: https://dx.doi.org/10.1016/j.talanta.2020.121512.
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Basic information
Original name Influence of sample surface topography on laser ablation process
Authors SALAJKOVÁ, Zita (203 Czech Republic), Markéta HOLÁ (203 Czech Republic, guarantor, belonging to the institution), David PROCHÁZKA (203 Czech Republic), Jakub ONDRÁČEK (203 Czech Republic), David PAVLIŇÁK (203 Czech Republic, belonging to the institution), Ladislav ČELKO (203 Czech Republic), Filip GREGAR (203 Czech Republic, belonging to the institution), Petr ŠPERKA, Pavel POŘÍZKA, Viktor KANICKÝ (203 Czech Republic, belonging to the institution), Alessandro DE GIACOMO and Jozef KAISER.
Edition Talanta, Amsterdam, Elsevier, 2021, 0039-9140.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10400 1.4 Chemical sciences
Country of publisher Netherlands
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 6.556
RIV identification code RIV/00216224:14310/21:00120799
Organization unit Faculty of Science
Doi http://dx.doi.org/10.1016/j.talanta.2020.121512
UT WoS 000589944000010
Keywords in English Laser ablation; LA-ICP-MS; Surface analysis; Surface topography; Fractionation
Tags rivok
Tags International impact, Reviewed
Changed by Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 22/2/2023 15:30.
Abstract
In this work we discuss how sample surface topography can significantly influence the laser ablation (LA) process and, in turn, the analytical response of the LA Inductively Coupled Plasma Mass Spectrometr y (LA-ICP-MS) method. Six different surface topographies were prepared on a certified aluminiu m alloy sample BAM 311 and SRM NIST 610 to investigate the phenomenon. A l l the samples were repetitively measured by LA-ICP-MS using a spot by spot analysis. The effect oflaserfluence in the range of 1-13 J/cm(2) was studied . For majority ofmeasured isotopes, the ICP-MS signal was amplified with roughening of the sample surface. A stronger effect was observed on the Al alloy sample, where the more than sixty-time enhancement was achieved in comparison to the polished surface of the sample. Since the effect of surface topography is different for each analyte, it can be stated that surface properties affect not only the ICP-MS response, but also elemental fractionation in LA . The presented results show that different surface topographies may lead to misleading data interpretation because even when applying ablation preshots, the signal of individual elements changes. The utmost care must be taken when preparing the surface for single shot analysis or chemical mapping. On the other hand, by roughening the sample surface, it is possible to significantly increase the sensitivity of the method for individual analytes and supress a matrix effect.
Links
LQ1601, research and development projectName: CEITEC 2020 (Acronym: CEITEC2020)
Investor: Ministry of Education, Youth and Sports of the CR
90110, large research infrastructuresName: CzechNanoLab
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