Watching nanomaterials with X-ray eyes: Probing different
length scales by combining scattering with spectroscopy

J 2020

Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

GIANNINI, Cinzia, Václav HOLÝ, Liberato DE CARO, Lorenzo MINO, Carlo LAMBERTI et. al.

Basic information

Original name

Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

Authors

GIANNINI, Cinzia, Václav HOLÝ (203 Czech Republic, guarantor, belonging to the institution), Liberato DE CARO, Lorenzo MINO and Carlo LAMBERTI

Edition

Progress in Materials Science, Oxford, Elsevier, 2020, 0079-6425

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

United Kingdom of Great Britain and Northern Ireland

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

URL

Impact factor

Impact factor: 39.580

RIV identification code

RIV/00216224:14740/20:00117383

Organization unit

Central European Institute of Technology

DOI

http://dx.doi.org/10.1016/j.pmatsci.2020.100667

UT WoS

000536816300006

Keywords in English

X-ray eyes; length scales

Abstract

V originále

Everybody dreams to have X-ray eyes and discover the most invisible secrets of the world around us. X-rays can probe matter (depth resolved) down to atomic resolution, if relying on diffraction-based techniques. An X-ray diffraction pattern may contain information over many length scales (atomic structure, microstructure, mesostructure). This peculiarity justifies the well-recognized impact of several X-ray diffraction-based techniques to diverse fields of research. On the other hand, X-ray spectroscopies (both in absorption and in emission) provide insights on the electronic structure and, exploiting element selectivity and local environment, can complement or even replace scattering techniques for diluted systems and amorphous materials. Herein, we provide a theoretical foundation which spans from very basic concepts, through well-known techniques, with applications to nanomaterials research. An increasing level of material complexity is explored: size and shape analysis of nanoparticles dispersed in solution or single nanostructures localized onto surfaces; local morphology/strain analysis of nanostructured surfaces; average defects analysis of stacking faulted nanocrystals; regular 2D and 3D lattices of self-assembled nanocrystals; clusters of nanocrystals without any nanoscale lattice order, standing alone as isolated objects or embedded in tenths-of-mu m-thick polymers (here coherent and focused X-rays are mandatory to explore the spatial inhomogeneity and lattice (in)coherence of the materials).

Citovat

GIANNINI, Cinzia, Václav HOLÝ, Liberato DE CARO, Lorenzo MINO and Carlo LAMBERTI. Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy. Progress in Materials Science. Oxford: Elsevier, 2020, vol. 112, JUL 2020, p. 1-70. ISSN 0079-6425. Available from: https://dx.doi.org/10.1016/j.pmatsci.2020.100667.

@article{1710857,
   author = {Giannini, Cinzia and Holý, Václav and De Caro, Liberato and Mino, Lorenzo and Lamberti, Carlo},
   article_location = {Oxford},
   article_number = {JUL 2020},
   doi = {http://dx.doi.org/10.1016/j.pmatsci.2020.100667},
   keywords = {X-ray eyes; length scales},
   language = {eng},
   issn = {0079-6425},
   journal = {Progress in Materials Science},
   title = {Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy},
   url = {https://doi.org/10.1016/j.pmatsci.2020.100667},
   volume = {112},
   year = {2020}
}

TY  - JOUR
ID  - 1710857
AU  - Giannini, Cinzia - Holý, Václav - De Caro, Liberato - Mino, Lorenzo - Lamberti, Carlo
PY  - 2020
TI  - Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy
JF  - Progress in Materials Science
VL  - 112
IS  - JUL 2020
SP  - 1-70
EP  - 1-70
PB  - Elsevier
SN  - 00796425
KW  - X-ray eyes
KW  - length scales
UR  - https://doi.org/10.1016/j.pmatsci.2020.100667
L2  - https://doi.org/10.1016/j.pmatsci.2020.100667
N2  - Everybody dreams to have X-ray eyes and discover the most invisible secrets of the world around us. X-rays can probe matter (depth resolved) down to atomic resolution, if relying on diffraction-based techniques. An X-ray diffraction pattern may contain information over many length scales (atomic structure, microstructure, mesostructure). This peculiarity justifies the well-recognized impact of several X-ray diffraction-based techniques to diverse fields of research. On the other hand, X-ray spectroscopies (both in absorption and in emission) provide insights on the electronic structure and, exploiting element selectivity and local environment, can complement or even replace scattering techniques for diluted systems and amorphous materials. Herein, we provide a theoretical foundation which spans from very basic concepts, through well-known techniques, with applications to nanomaterials research. An increasing level of material complexity is explored: size and shape analysis of nanoparticles dispersed in solution or single nanostructures localized onto surfaces; local morphology/strain analysis of nanostructured surfaces; average defects analysis of stacking faulted nanocrystals; regular 2D and 3D lattices of self-assembled nanocrystals; clusters of nanocrystals without any nanoscale lattice order, standing alone as isolated objects or embedded in tenths-of-mu m-thick polymers (here coherent and focused X-rays are mandatory to explore the spatial inhomogeneity and lattice (in)coherence of the materials).
ER  -

GIANNINI, Cinzia, Václav HOLÝ, Liberato DE CARO, Lorenzo MINO and Carlo LAMBERTI. Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy. \textit{Progress in Materials Science}. Oxford: Elsevier, 2020, vol.~112, JUL 2020, p.~1-70. ISSN~0079-6425. Available from: https://dx.doi.org/10.1016/j.pmatsci.2020.100667.

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