ŘIHÁČEK, Tomáš, Michal HORÁK, Thomas SCHACHINGER, Filip MIKA, Milan MATĚJKA, Stanislav KRÁTKÝ, Tomáš FOŘT, Tomáš RADLIČKA, Cameron W. JOHNSON, Libor NOVÁK, SEĎA, Benjamin J. MCMORRAN and Ilona MÜLLEROVÁ. Beam shaping and probe characterization in the scanning electron microscope. Ultramicroscopy. Amsterdam: North Holland, 2021, vol. 225, 9 pp. ISSN 0304-3991. Available from: https://dx.doi.org/10.1016/j.ultramic.2021.113268. |
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@article{1771338, author = {Řiháček, Tomáš and Horák, Michal and Schachinger, Thomas and Mika, Filip and Matějka, Milan and Krátký, Stanislav and Fořt, Tomáš and Radlička, Tomáš and Johnson, Cameron W. and Novák, Libor and Seďa, and McMorran, Benjamin J. and Müllerová, Ilona}, article_location = {Amsterdam}, doi = {http://dx.doi.org/10.1016/j.ultramic.2021.113268}, keywords = {Electron diffraction; SEM; Electron beam structuring; Spot shape measurement; Electron vortex beam}, language = {eng}, issn = {0304-3991}, journal = {Ultramicroscopy}, title = {Beam shaping and probe characterization in the scanning electron microscope}, volume = {225}, year = {2021} }
TY - JOUR ID - 1771338 AU - Řiháček, Tomáš - Horák, Michal - Schachinger, Thomas - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Fořt, Tomáš - Radlička, Tomáš - Johnson, Cameron W. - Novák, Libor - Seďa, AU - McMorran, Benjamin J. - Müllerová, Ilona PY - 2021 TI - Beam shaping and probe characterization in the scanning electron microscope JF - Ultramicroscopy VL - 225 PB - North Holland SN - 03043991 KW - Electron diffraction KW - SEM KW - Electron beam structuring KW - Spot shape measurement KW - Electron vortex beam N2 - Here we demonstrate the use of nanofabricated grating holograms to diffract and shape electrons in a scanning electron microscope. The diffraction grating is placed in an aperture in the column. The entire diffraction pattern can be passed through the objective lens and projected onto the specimen, or an intermediate aperture can be used to select particular diffracted beams. We discuss several techniques for characterizing the diffraction pattern. The grating designs can incorporate features that can influence the phase and intensity of the diffracted SEM probe. We demonstrate this by producing electron vortex beams. ER -
ŘIHÁČEK, Tomáš, Michal HORÁK, Thomas SCHACHINGER, Filip MIKA, Milan MATĚJKA, Stanislav KRÁTKÝ, Tomáš FOŘT, Tomáš RADLIČKA, Cameron W. JOHNSON, Libor NOVÁK, SEĎA, Benjamin J. MCMORRAN and Ilona MÜLLEROVÁ. Beam shaping and probe characterization in the scanning electron microscope. \textit{Ultramicroscopy}. Amsterdam: North Holland, 2021, vol.~225, 9 pp. ISSN~0304-3991. Available from: https://dx.doi.org/10.1016/j.ultramic.2021.113268.
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