Nanoimaging of Orientational Defects in Semiconducting Organic
Films

J 2021

Nanoimaging of Orientational Defects in Semiconducting Organic Films

MRKYVKOVA, Nada, Adrian CERNESCU, Zdenek FUTERA, Alois NEBOJSA, Adam DUBROKA et. al.

Basic information

Original name

Nanoimaging of Orientational Defects in Semiconducting Organic Films

Authors

MRKYVKOVA, Nada (guarantor), Adrian CERNESCU, Zdenek FUTERA, Alois NEBOJSA (203 Czech Republic, belonging to the institution), Adam DUBROKA (203 Czech Republic, belonging to the institution), Michaela SOJKOVA, Martin HULMAN, Eva MAJKOVA, Matej JERGEL, Peter SIFFALOVIC and Frank SCHREIBER

Edition

Journal of Physical Chemistry C, Washington D.C. American Chemical Society, 2021, 1932-7447

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

United States of America

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

URL

Impact factor

Impact factor: 4.177

RIV identification code

RIV/00216224:14310/21:00119566

Organization unit

Faculty of Science

DOI

http://dx.doi.org/10.1021/acs.jpcc.1c00059

UT WoS

000648873500031

Keywords in English

Molecular properties; Defects; Layers; Molecules; Oscillation

Abstract

V originále

The development of defect analysis for inorganic semiconductors in the past century paved the way for the success story of today's electronics. By analogy, defect analysis plays a critical role in developing and improving devices based on organic molecular semiconductors. However, because of weak molecular interactions, absent in inorganic semiconductors, device-relevant thin organic films are susceptible to the formation of defects in the molecular orientation, which in turn have a profound impact on the performance in the optoelectronic applications. To address this problem, we broaden the applicability of scattering-type scanning near-field optical microscopy (s-SNOM) and utilize the light-induced anisotropic response of vibrational modes to reveal the defects in molecular orientation. We show that in the case of molecular islands with steep crystal facets only the scattered s-SNOM optical amplitude can be exploited to describe the molecular arrangement reliably, while the phase-based analysis leads to artifacts. The presented s-SNOM analysis of molecular defects can be universally applied to diverse topographies, even at the nanoscale.

Links

GA20-10377S, research and development project

Name: Jevy v heterostrukturách oxidů přechodových kovů vyvolané dopováním a rozhraním (Acronym: TMO Heterostructures)

Investor: Czech Science Foundation

LM2018140, research and development project

Name: e-Infrastruktura CZ (Acronym: e-INFRA CZ)

Investor: Ministry of Education, Youth and Sports of the CR

90110, large research infrastructures

Name: CzechNanoLab

Citovat

MRKYVKOVA, Nada, Adrian CERNESCU, Zdenek FUTERA, Alois NEBOJSA, Adam DUBROKA, Michaela SOJKOVA, Martin HULMAN, Eva MAJKOVA, Matej JERGEL, Peter SIFFALOVIC and Frank SCHREIBER. Nanoimaging of Orientational Defects in Semiconducting Organic Films. Journal of Physical Chemistry C. Washington D.C.: American Chemical Society, 2021, vol. 125, No 17, p. 9229-9235. ISSN 1932-7447. Available from: https://dx.doi.org/10.1021/acs.jpcc.1c00059.

@article{1821618,
   author = {Mrkyvkova, Nada and Cernescu, Adrian and Futera, Zdenek and Nebojsa, Alois and Dubroka, Adam and Sojkova, Michaela and Hulman, Martin and Majkova, Eva and Jergel, Matej and Siffalovic, Peter and Schreiber, Frank},
   article_location = {Washington D.C.},
   article_number = {17},
   doi = {http://dx.doi.org/10.1021/acs.jpcc.1c00059},
   keywords = {Molecular properties; Defects; Layers; Molecules; Oscillation},
   language = {eng},
   issn = {1932-7447},
   journal = {Journal of Physical Chemistry C},
   title = {Nanoimaging of Orientational Defects in Semiconducting Organic Films},
   url = {https://pubs.acs.org/doi/10.1021/acs.jpcc.1c00059},
   volume = {125},
   year = {2021}
}

TY  - JOUR
ID  - 1821618
AU  - Mrkyvkova, Nada - Cernescu, Adrian - Futera, Zdenek - Nebojsa, Alois - Dubroka, Adam - Sojkova, Michaela - Hulman, Martin - Majkova, Eva - Jergel, Matej - Siffalovic, Peter - Schreiber, Frank
PY  - 2021
TI  - Nanoimaging of Orientational Defects in Semiconducting Organic Films
JF  - Journal of Physical Chemistry C
VL  - 125
IS  - 17
SP  - 9229-9235
EP  - 9229-9235
PB  - American Chemical Society
SN  - 19327447
KW  - Molecular properties
KW  - Defects
KW  - Layers
KW  - Molecules
KW  - Oscillation
UR  - https://pubs.acs.org/doi/10.1021/acs.jpcc.1c00059
N2  - The development of defect analysis for inorganic semiconductors in the past century paved the way for the success story of today's electronics. By analogy, defect analysis plays a critical role in developing and improving devices based on organic molecular semiconductors. However, because of weak molecular interactions, absent in inorganic semiconductors, device-relevant thin organic films are susceptible to the formation of defects in the molecular orientation, which in turn have a profound impact on the performance in the optoelectronic applications. To address this problem, we broaden the applicability of scattering-type scanning near-field optical microscopy (s-SNOM) and utilize the light-induced anisotropic response of vibrational modes to reveal the defects in molecular orientation. We show that in the case of molecular islands with steep crystal facets only the scattered s-SNOM optical amplitude can be exploited to describe the molecular arrangement reliably, while the phase-based analysis leads to artifacts. The presented s-SNOM analysis of molecular defects can be universally applied to diverse topographies, even at the nanoscale.
ER  -

MRKYVKOVA, Nada, Adrian CERNESCU, Zdenek FUTERA, Alois NEBOJSA, Adam DUBROKA, Michaela SOJKOVA, Martin HULMAN, Eva MAJKOVA, Matej JERGEL, Peter SIFFALOVIC and Frank SCHREIBER. Nanoimaging of Orientational Defects in Semiconducting Organic Films. \textit{Journal of Physical Chemistry C}. Washington D.C.: American Chemical Society, 2021, vol.~125, No~17, p.~9229-9235. ISSN~1932-7447. Available from: https://dx.doi.org/10.1021/acs.jpcc.1c00059.

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