| SÝS, Marek, Ľubomír OBRÁTIL, Václav MATYÁŠ and Dušan KLINEC. A Bad Day to Die Hard: Correcting the Dieharder Battery. Journal of Cryptology. SPRINGER, 2022, vol. 35, No 1, p. 1-20. ISSN 0933-2790. Available from: https://dx.doi.org/10.1007/s00145-021-09414-y. |
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@article{1848587,
author = {Sýs, Marek and Obrátil, Ľubomír and Matyáš, Václav and Klinec, Dušan},
article_number = {1},
doi = {http://dx.doi.org/10.1007/s00145-021-09414-y},
keywords = {Dieharder batéria test náhodnosti p-hodnota Kolmogorov–Smirnov test},
language = {eng},
issn = {0933-2790},
journal = {Journal of Cryptology},
title = {A Bad Day to Die Hard: Correcting the Dieharder Battery},
url = {https://link.springer.com/content/pdf/10.1007/s00145-021-09414-y.pdf},
volume = {35},
year = {2022}
}
TY - JOUR
ID - 1848587
AU - Sýs, Marek - Obrátil, Ľubomír - Matyáš, Václav - Klinec, Dušan
PY - 2022
TI - A Bad Day to Die Hard: Correcting the Dieharder Battery
JF - Journal of Cryptology
VL - 35
IS - 1
SP - 1-20
EP - 1-20
PB - SPRINGER
SN - 09332790
KW - Dieharder batéria test náhodnosti p-hodnota Kolmogorov–Smirnov test
UR - https://link.springer.com/content/pdf/10.1007/s00145-021-09414-y.pdf
N2 - We analyze Dieharder statistical randomness tests according to accuracy and correct interpretation of their results. We used all tests, processed 8 TB of quantum-generated data, and obtained null distributions of first-level and second-level p-values. We inspected whether the p-values are uniformly distributed. The analysis showed that more than half (out of 110) of Dierharder atomic tests (test with particular setting) produce null distributions of p-values that are biased from the expected uniform one. Additional analysis of the Kolmogorov-Smirnov (KS) test showed that the key KS test is also biased. This increases the probability of false positives (in the right tail) for all Dieharder tests as KS is used to post-process their results. Moreover, 12 tests (22 atomic) produce results significantly biased from the null distribution of the KS test which may suggest problems with the implementation of these tests.
ER -
SÝS, Marek, Ľubomír OBRÁTIL, Václav MATYÁŠ and Dušan KLINEC. A Bad Day to Die Hard: Correcting the Dieharder Battery. \textit{Journal of Cryptology}. SPRINGER, 2022, vol.~35, No~1, p.~1-20. ISSN~0933-2790. Available from: https://dx.doi.org/10.1007/s00145-021-09414-y.
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