ŠŤASTNÝ, Jiří, Petr SLÁDEK and Pavel SŤAHEL. Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys. In Proceedings of Contributed Papers, konference WDS 97 Praha. Praha: UK, Matematicko-fyzikální fakulta, 1997, p. 388. |
Other formats:
BibTeX
LaTeX
RIS
@inbook{194425, author = {Šťastný, Jiří and Sládek, Petr and Sťahel, Pavel}, address = {Praha}, booktitle = {Proceedings of Contributed Papers, konference WDS 97 Praha}, language = {eng}, location = {Praha}, pages = {388-388}, publisher = {UK, Matematicko-fyzikální fakulta}, title = {Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys}, year = {1997} }
TY - CHAP ID - 194425 AU - Šťastný, Jiří - Sládek, Petr - Sťahel, Pavel PY - 1997 TI - Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys PB - UK, Matematicko-fyzikální fakulta CY - Praha ER -
ŠŤASTNÝ, Jiří, Petr SLÁDEK and Pavel SŤAHEL. Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys. In \textit{Proceedings of Contributed Papers, konference WDS 97 Praha}. Praha: UK, Matematicko-fyzikální fakulta, 1997, p.~388.
|