ŠŤASTNÝ, Jiří, Petr SLÁDEK and Pavel SŤAHEL. Microhardness measurements of the thin layers of the amorphous drogenated silicon. In JUNIORMAT 97. Brno: Ústav materiálového inženýrství, fakulta strojní VUT Brno, 1997, p. 388. ISBN 80-86122-04-2.
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Basic information
Original name Microhardness measurements of the thin layers of the amorphous drogenated silicon
Authors ŠŤASTNÝ, Jiří, Petr SLÁDEK and Pavel SŤAHEL.
Edition Brno, JUNIORMAT 97, p. 388-388, 1997.
Publisher Ústav materiálového inženýrství, fakulta strojní VUT Brno
Other information
Original language English
Type of outcome Chapter(s) of a specialized book
Field of Study 10302 Condensed matter physics
Confidentiality degree is not subject to a state or trade secret
Organization unit Faculty of Education
ISBN 80-86122-04-2
Changed by Changed by: doc. RNDr. Petr Sládek, CSc., učo 1617. Changed: 28/5/1999 09:38.
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