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@article{196781, author = {Musilová, Jana and Ohlídal, Ivan}, article_number = {1}, keywords = {thin films}, language = {eng}, issn = {0022-3727}, journal = {J. Phys. D: Appl. Phys.}, title = {Influence of defects of thin films on determining their thickness by the method based on white light interference}, volume = {25(1992)}, year = {1993} }
TY - JOUR ID - 196781 AU - Musilová, Jana - Ohlídal, Ivan PY - 1993 TI - Influence of defects of thin films on determining their thickness by the method based on white light interference JF - J. Phys. D: Appl. Phys. VL - 25(1992) IS - 1 SP - 1131 EP - 1131 SN - 00223727 KW - thin films N2 - Method of determining the thickness of a thin film by white light interference. Influence of defects. ER -
MUSILOVÁ, Jana and Ivan OHLÍDAL. Influence of defects of thin films on determining their thickness by the method based on white light interference (Influence of defects of thin films on determining their thi ckness by the method based on white light interference). \textit{J. Phys. D: Appl. Phys.}. 1993, 25(1992), No~1, p.~1131-1138. ISSN~0022-3727.
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